// Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 //

 /**

  @file

  @test

 */

 #ifndef __EGLTEST_STRESS_PROCESS_SGIMAGE_H__

 #define __EGLTEST_STRESS_PROCESS_SGIMAGE_H__

 #include "egltest_stress_common_sgimage.h"

 /**

 Standard prototypes

 */

 GLDEF_C TInt E32Main(void);

 LOCAL_C void LaunchClientProcessL();

 //Panic string

 _LIT(KStressTestChildAppPanic, "Stress Test Child App");

 class CTReadWriteChild : public CTReadWrite

     {

 public:

     static CTReadWriteChild* NewL(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);

 private:

     CTReadWriteChild(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);

     void ReadImageFuncL();

     void ReadFuncL();

     void WriteImageFuncL();

     void VgImageFuncL();

     void MakeCurrentL() const;

     TBool IsFinished();

     void PixmapSurfaceFuncL();

 private:

     VGImage iImage;

     };

 #endif //__EGLTEST_STRESS_PROCESS_SGIMAGE_H__