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// Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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//
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/**
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@file
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@test
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*/
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#ifndef __EGLTEST_STRESS_PROCESS_SGIMAGE_H__
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#define __EGLTEST_STRESS_PROCESS_SGIMAGE_H__
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#include "egltest_stress_common_sgimage.h"
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/**
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Standard prototypes
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*/
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GLDEF_C TInt E32Main(void);
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LOCAL_C void LaunchClientProcessL();
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//Panic string
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_LIT(KStressTestChildAppPanic, "Stress Test Child App");
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class CTReadWriteChild : public CTReadWrite
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{
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public:
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static CTReadWriteChild* NewL(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);
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private:
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CTReadWriteChild(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);
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void ReadImageFuncL();
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void ReadFuncL();
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void WriteImageFuncL();
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void VgImageFuncL();
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void MakeCurrentL() const;
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TBool IsFinished();
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void PixmapSurfaceFuncL();
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private:
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VGImage iImage;
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};
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#endif //__EGLTEST_STRESS_PROCESS_SGIMAGE_H__
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