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// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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// t_main
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// Main test harness for t_tinternetdate
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//
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//
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// MEMORY LEAK TESTING - Change and recompile to enable memory leak testing
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// #define __MEMORY_LEAK_TESTING_ENABLED
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#include <e32base.h>
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#include "IpuTestUtils.h"
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#include "cconverttorfc1123formtest.h"
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_LIT(KTestPanic, "TInetDate");
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_LIT(KTestTitle, "T_TInternetDate");
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GLDEF_C void Panic(TInt aPanic);
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GLDEF_C void Panic(TInt aPanic)
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{
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User::Panic(KTestPanic,aPanic);
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}
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GLDEF_C void TestL()
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{
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CIpuTestHarness* testHarness = CIpuTestHarness::NewL(KTestTitle);
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CleanupStack::PushL(testHarness);
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testHarness->DoResourceLeakTest(ETrue);
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testHarness->LogIt(_L ("@SYMTestCaseID IWS-APPPROTOCOLS-INETPROTUTIL-T_TINTERNETDATE-0001 "));
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CConvertToRfc1123FormTest* convertToRfc1123FormTest = CConvertToRfc1123FormTest::NewLC(testHarness);
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#ifdef __MEMORY_LEAK_TESTING_ENABLED
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CTestBase::MemoryLeakTestL(*convertToRfc1123FormTest,*testHarness);
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#endif
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convertToRfc1123FormTest->DoTestsL();
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CleanupStack::PopAndDestroy(2, testHarness);
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}
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GLDEF_C TInt E32Main()
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//
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// Main function
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{
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__UHEAP_MARK;
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CTrapCleanup* tc=CTrapCleanup::New();
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TRAPD(err,TestL());
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if (err!=KErrNone)
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User::Panic(_L("Test Fail"),err);
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delete tc;
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__UHEAP_MARKEND;
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return KErrNone;
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}
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