// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 // t_main

 // Main test harness for t_tinternetdate

 // 

 //

 // MEMORY LEAK TESTING - Change and recompile to enable memory leak testing

 // #define __MEMORY_LEAK_TESTING_ENABLED

 #include <e32base.h>

 #include "IpuTestUtils.h"

 #include "cconverttorfc1123formtest.h"

 _LIT(KTestPanic, "TInetDate");

 _LIT(KTestTitle, "T_TInternetDate");

 GLDEF_C void Panic(TInt aPanic);

 GLDEF_C void Panic(TInt aPanic)

 	{

 	User::Panic(KTestPanic,aPanic);

 	}

 GLDEF_C void TestL()

 	{

 	CIpuTestHarness* testHarness = CIpuTestHarness::NewL(KTestTitle);

 	CleanupStack::PushL(testHarness);

 	testHarness->DoResourceLeakTest(ETrue);

 	testHarness->LogIt(_L ("@SYMTestCaseID IWS-APPPROTOCOLS-INETPROTUTIL-T_TINTERNETDATE-0001 "));

 	CConvertToRfc1123FormTest* convertToRfc1123FormTest = CConvertToRfc1123FormTest::NewLC(testHarness);

 #ifdef __MEMORY_LEAK_TESTING_ENABLED

 	CTestBase::MemoryLeakTestL(*convertToRfc1123FormTest,*testHarness);

 #endif

 	convertToRfc1123FormTest->DoTestsL();

 	CleanupStack::PopAndDestroy(2, testHarness);

 	}

 GLDEF_C TInt E32Main()

 //

 // Main function

 	{

 	__UHEAP_MARK;

 	CTrapCleanup* tc=CTrapCleanup::New();

 	TRAPD(err,TestL());

 	if (err!=KErrNone)

 		User::Panic(_L("Test Fail"),err);

 	delete tc;

 	__UHEAP_MARKEND;

 	return KErrNone;

 	}