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// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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// DEF075471 buffer security test
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//
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//
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/**
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@file
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@test
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@internalComponent - Internal Symbian test code
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*/
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#ifndef __TBUFFERSECURITY_H__
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#define __TBUFFERSECURITY_H__
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#include "AUTO.H"
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#include "../tlib/testbase.h"
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#include <w32std.h>
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#include "../SERVER/w32cmd.h"
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#ifdef TEST_GRAPHICS_WSERV_TAUTOSERVER_NONNGA
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#include "../nonnga/CLIENT/w32comm.h"
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#endif
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#ifdef TEST_GRAPHICS_WSERV_TAUTOSERVER_NGA
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#include "../nga/CLIENT/w32comm.h"
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#endif
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#include <e32property.h>
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#include "TGraphicsHarness.h"
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//Set this #define to add extra logging to this test case (useful when debugging a test fail)
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//#define _TBUFS_LOGGING
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//Set this #define to initiate a long running soak test, this should be done periodically
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//#define _TBUFS_TEST_SOAK_TEST
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#ifdef _TBUFS_LOGGING
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#define TBufSStartLogText StartLogText
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#define TBufSLogText LogText
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#define TBufSLogFormat LogFormat
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#else
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#define TBufSStartLogText
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#define TBufSLogText
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#define TBufSLogFormat
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#endif
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LOCAL_D const TUint KPanicThreadHeapSize=0x4000;
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_LIT(KLitKernExec, "KERN-EXEC");
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_LIT(KTestName, "DEF086238 Buffer Security Test");
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static _LIT_SECURITY_POLICY_PASS(KAllowAllPolicy);
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static _LIT_SECURITY_POLICY_C1(KWriteDeviceDataMgmtPolicy,ECapabilityWriteDeviceData);
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const TInt KTestDataMax = 256;
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const TInt KTestDataMax32 = KTestDataMax/4;
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struct TTestThreadData
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{
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TInt iOpCode;
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union
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{
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TUint8 iData[KTestDataMax];
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TUint32 iData32[KTestDataMax32];
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};
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TInt iDataLength;
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};
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enum KBufSecTestType
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{
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EBufSecUnInitialised,
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EBufSecRandom,
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EBufSecZero
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};
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union TTestDataStore
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{
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TAny *any;
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TWsClCmdSetPointerCursorArea* cursorArea;
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TWsClCmdHeapSetFail *heapSetFail;
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TXYInputType *xyInputType;
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};
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class CTBufferSecurity : public CTWsGraphicsBase
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{
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public:
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CTBufferSecurity(CTestStep* aStep);
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~CTBufferSecurity();
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void TestWsBufferL(TInt aOpCode, TUint aDataFill, TBool aEightBit=ETrue);
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void TestBadStringAnimDllL();
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void TestBadStringL();
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void TestBadIpcL();
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void ConstructL();
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protected:
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//from CTGraphicsStep
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virtual void RunTestCaseL(TInt aCurTestCase);
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private:
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void TestBufferSecurityL();
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};
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class RTestIpcSession : public RSessionBase
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{
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public:
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inline RTestIpcSession() {};
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TInt Connect();
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TInt SendBadBuffer();
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private:
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TInt iWsHandle;
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};
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class CTBufferSecurityStep : public CTGraphicsStep
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{
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public:
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CTBufferSecurityStep();
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protected:
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//from CTGraphicsStep
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virtual CTGraphicsBase* CreateTestL();
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};
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_LIT(KTBufferSecurityStep,"TBufferSecurity");
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#endif
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