// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 // DEF075471 buffer security test

 // 

 //

 /**

  @file

  @test

  @internalComponent - Internal Symbian test code

 */

 #ifndef __TBUFFERSECURITY_H__

 #define __TBUFFERSECURITY_H__

 #include "AUTO.H"

 #include "../tlib/testbase.h"

 #include <w32std.h>

 #include "../SERVER/w32cmd.h"

 #ifdef TEST_GRAPHICS_WSERV_TAUTOSERVER_NONNGA

 #include "../nonnga/CLIENT/w32comm.h"

 #endif

 #ifdef TEST_GRAPHICS_WSERV_TAUTOSERVER_NGA

 #include "../nga/CLIENT/w32comm.h"

 #endif

 #include <e32property.h>

 #include "TGraphicsHarness.h"

 //Set this #define to add extra logging to this test case (useful when debugging a test fail)

 //#define _TBUFS_LOGGING

 //Set this #define to initiate a long running soak test, this should be done periodically

 //#define _TBUFS_TEST_SOAK_TEST

 #ifdef _TBUFS_LOGGING

 #define TBufSStartLogText StartLogText

 #define TBufSLogText LogText

 #define TBufSLogFormat LogFormat

 #else

 #define TBufSStartLogText

 #define TBufSLogText

 #define TBufSLogFormat

 #endif

 LOCAL_D const TUint KPanicThreadHeapSize=0x4000;

 _LIT(KLitKernExec, "KERN-EXEC");

 _LIT(KTestName, "DEF086238 Buffer Security Test");

 static _LIT_SECURITY_POLICY_PASS(KAllowAllPolicy);

 static _LIT_SECURITY_POLICY_C1(KWriteDeviceDataMgmtPolicy,ECapabilityWriteDeviceData);

 const TInt KTestDataMax = 256;

 const TInt KTestDataMax32 = KTestDataMax/4;

 struct TTestThreadData

 	{

 	TInt iOpCode;

 	union

 		{

 		TUint8 iData[KTestDataMax];

 		TUint32 iData32[KTestDataMax32];

 		};

 	TInt iDataLength;

 	};

 enum KBufSecTestType

 	{

 	EBufSecUnInitialised,

 	EBufSecRandom,

 	EBufSecZero

 	};

 union TTestDataStore

 	{

 	TAny *any;

 	TWsClCmdSetPointerCursorArea* cursorArea;

 	TWsClCmdHeapSetFail *heapSetFail;

 	TXYInputType *xyInputType;

 	};

 class CTBufferSecurity : public CTWsGraphicsBase

 	{

 public:

 	CTBufferSecurity(CTestStep* aStep);

 	~CTBufferSecurity();

 	void TestWsBufferL(TInt aOpCode, TUint aDataFill, TBool aEightBit=ETrue);

 	void TestBadStringAnimDllL();

 	void TestBadStringL();

 	void TestBadIpcL();

 	void ConstructL();

 protected:

 //from 	CTGraphicsStep

 	virtual void RunTestCaseL(TInt aCurTestCase);

 private:

 	void TestBufferSecurityL();

 	};

 class RTestIpcSession : public RSessionBase

 	{

 public:

 	inline RTestIpcSession() {};

 	TInt Connect();

 	TInt SendBadBuffer();

 private:

 	TInt iWsHandle;

 	};

 class CTBufferSecurityStep : public CTGraphicsStep

 	{

 public:

 	CTBufferSecurityStep();

 protected:

 	//from CTGraphicsStep

 	virtual CTGraphicsBase* CreateTestL();

 	};

 _LIT(KTBufferSecurityStep,"TBufferSecurity");

 #endif