// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 //

 /**

  @file

  @test

  @internalComponent - Internal Symbian test code 

 */

 #ifndef __EFMTESTSTEPBASE__

 #define __EFMTESTSTEPBASE__

 #include <test/testexecutestepbase.h>

 #include "efm_test_consts.h"

 /*

 test type section name 

 test type section indicates whether the test step is performed in normal 

 or low capabilty environment

 */

 _LIT(KTestLowCap, "testlowcap");

 _LIT(KTestOOM, "testOOM");

 //macros used for testing

 #define TESTDIAGNOSTIC(cond,message)\

    if (!(cond))\

    {\

    ERR_PRINTF1( message);\

    SetTestStepResult(EFail);\

    }

 #define TESTDIAGNOSTICERROR(cond,message,error)\

    if (!(cond))\

    {\

    ERR_PRINTF2( message, error );\

    SetTestStepResult(EFail);\

    }   

 /** Test step that publishes features required by the rest of test steps

 */

 _LIT(KEFMTestStepPublishFeatures, "EFMTestStepPublishFeatures");

 class CEFMTestStepPublishFeatures : public CTestStep

    {

 public:

    CEFMTestStepPublishFeatures();

    virtual TVerdict doTestStepL(void);

    };

 /** Base class for configurable test steps

 */

 class CEFMConfigurableTestStepBase : public CTestStep

    {

 public:

    	virtual TVerdict doTestStepPreambleL(void);   

 protected:

 	virtual void CheckCondition(TBool aMainCondition, TBool aOOMCondition, TPtrC aLoggingMessage, TInt aErrorCode);

    TBool iLowCap;

    TBool iOOM;

    };    

 #endif