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// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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//
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/**
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@file
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@test
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@internalComponent - Internal Symbian test code
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*/
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#ifndef __EFMTESTSTEPBASE__
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#define __EFMTESTSTEPBASE__
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#include <test/testexecutestepbase.h>
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#include "efm_test_consts.h"
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/*
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test type section name
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test type section indicates whether the test step is performed in normal
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or low capabilty environment
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*/
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_LIT(KTestLowCap, "testlowcap");
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_LIT(KTestOOM, "testOOM");
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//macros used for testing
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#define TESTDIAGNOSTIC(cond,message)\
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if (!(cond))\
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{\
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ERR_PRINTF1( message);\
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SetTestStepResult(EFail);\
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}
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#define TESTDIAGNOSTICERROR(cond,message,error)\
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if (!(cond))\
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{\
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ERR_PRINTF2( message, error );\
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SetTestStepResult(EFail);\
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}
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/** Test step that publishes features required by the rest of test steps
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*/
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_LIT(KEFMTestStepPublishFeatures, "EFMTestStepPublishFeatures");
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class CEFMTestStepPublishFeatures : public CTestStep
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{
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public:
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CEFMTestStepPublishFeatures();
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virtual TVerdict doTestStepL(void);
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};
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/** Base class for configurable test steps
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*/
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class CEFMConfigurableTestStepBase : public CTestStep
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{
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public:
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virtual TVerdict doTestStepPreambleL(void);
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protected:
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virtual void CheckCondition(TBool aMainCondition, TBool aOOMCondition, TPtrC aLoggingMessage, TInt aErrorCode);
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TBool iLowCap;
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TBool iOOM;
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};
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#endif
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