// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 //

 /**

 @file

 @test

 @internalComponent

 */

 #ifndef TTMSGRAPHICSSTEP_

 #define TTMSGRAPHICSSTEP_

 #include <test/testexecutestepbase.h>

 #include <w32std.h>

 #include <flogger.h>

 #include <badesca.h> 

 // default name that a test will be called if not specifically set in the calling object

 _LIT(KUnknownSYMTestCaseIDName, "@SYMTestCaseID Unnamed test");

 _LIT(KUndefinedSYMTestCaseIDName, "@SYMTestCaseID is not defined");

 _LIT(KNotATestSYMTestCaseIDName, "This is not a test");

 class CTMSDataColumn

 {

 public:

 TBuf8<256> iTheID;

 TBuf8<50> iTheResult;

 };

 class CTTMSGraphicsStep : public CTestStep

 	{

 public:

 	IMPORT_C CTTMSGraphicsStep();

 	IMPORT_C virtual ~CTTMSGraphicsStep();

 	IMPORT_C void CloseTMSGraphicsStep();

 	IMPORT_C void MQCTest(TBool aCondition, const TText8* aFile, TInt aLine);

 	IMPORT_C void MQCTestL(TBool aCondition, const TText8* aFile, TInt aLine);

 	IMPORT_C void SetTestStepID(const TDesC& aStepName);

 	IMPORT_C void SetOverallTestStepID(const TDesC& aStepName);

 	IMPORT_C void RecordTestResultL();

 	IMPORT_C void MultipleResultsForSameID(TBool aShowMultipleResults);

 	IMPORT_C void MQCTestWithErrorCode(TBool aCondition, TInt aErrorCode, const TText8* aFile, TInt aLine);

 	void DebugLogL(const TDesC8 &aText, const TDesC8 &aText1);

 protected:

 	void CleanUpAndWriteResults();

 	TBuf8<KMaxTestExecuteNameLength> iCurrentTestStepName;

 	TBool iStepPassFail;

 	TBool iShowMultipleResults;

 	RArray<CTMSDataColumn> iArrayTMSData;

 	};

 #endif /*TTMSGRAPHICSSTEP_*/