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// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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//
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/**
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@file
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@test
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@internalComponent
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*/
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#ifndef TTMSGRAPHICSSTEP_
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#define TTMSGRAPHICSSTEP_
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#include <test/testexecutestepbase.h>
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#include <w32std.h>
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#include <flogger.h>
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#include <badesca.h>
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// default name that a test will be called if not specifically set in the calling object
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_LIT(KUnknownSYMTestCaseIDName, "@SYMTestCaseID Unnamed test");
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_LIT(KUndefinedSYMTestCaseIDName, "@SYMTestCaseID is not defined");
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_LIT(KNotATestSYMTestCaseIDName, "This is not a test");
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class CTMSDataColumn
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{
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public:
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TBuf8<256> iTheID;
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TBuf8<50> iTheResult;
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};
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class CTTMSGraphicsStep : public CTestStep
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{
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public:
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IMPORT_C CTTMSGraphicsStep();
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IMPORT_C virtual ~CTTMSGraphicsStep();
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IMPORT_C void CloseTMSGraphicsStep();
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IMPORT_C void MQCTest(TBool aCondition, const TText8* aFile, TInt aLine);
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IMPORT_C void MQCTestL(TBool aCondition, const TText8* aFile, TInt aLine);
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IMPORT_C void SetTestStepID(const TDesC& aStepName);
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IMPORT_C void SetOverallTestStepID(const TDesC& aStepName);
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IMPORT_C void RecordTestResultL();
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IMPORT_C void MultipleResultsForSameID(TBool aShowMultipleResults);
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IMPORT_C void MQCTestWithErrorCode(TBool aCondition, TInt aErrorCode, const TText8* aFile, TInt aLine);
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void DebugLogL(const TDesC8 &aText, const TDesC8 &aText1);
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protected:
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void CleanUpAndWriteResults();
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TBuf8<KMaxTestExecuteNameLength> iCurrentTestStepName;
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TBool iStepPassFail;
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TBool iShowMultipleResults;
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RArray<CTMSDataColumn> iArrayTMSData;
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};
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#endif /*TTMSGRAPHICSSTEP_*/
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