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// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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// For the out of memory test of HAL initialise/ Persist functions :
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//
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//
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/**
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@file
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@internalComponent
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@test
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*/
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#include <e32base.h>
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#include "halfiles.h"
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#include <e32test.h>
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LOCAL_D RTest TheTest (_L ("OOM Tests"));
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/**
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@SYMTestCaseID SYSLIB-HALSETTINGS-CT-1711
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@SYMTestCaseDesc OOM Test Initialise HAL attributes
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@SYMTestPriority Medium
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@SYMTestActions Tests for the out of memory conditions
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@SYMTestExpectedResults Tests must not fail
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@SYMDEF DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out
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*/
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LOCAL_C void OOMTestInitialiseHAL()
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{
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TheTest.Next(_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1711 OOM test for InitialiseHAL() "));
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PersistHAL(); // to make sure HAL.DAT is on the system drive
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TInt err;
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TInt tryCount = 0;
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do
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{
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__UHEAP_MARK;
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__UHEAP_SETFAIL(RHeap::EDeterministic, ++tryCount);
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err = InitialiseHAL();
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__UHEAP_SETFAIL(RHeap::ENone, 0);
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__UHEAP_MARKEND;
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} while(err == KErrNoMemory);
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TheTest(err==KErrNone);
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TheTest.Printf(_L("- succeeded at heap failure rate of %i\n"), tryCount);
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}
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/**
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@SYMTestCaseID SYSLIB-HALSETTINGS-CT-1710
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@SYMTestCaseDesc OOM Test for Persist HAL attributes
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@SYMTestPriority Medium
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@SYMTestActions Tests for the out of memory conditions
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@SYMTestExpectedResults Tests must not fail
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@SYMDEF DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out
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*/
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LOCAL_C void OOMTestPersistHAL()
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{
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TheTest.Next(_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1710 OOM test for PersistHAL() "));
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TInt err;
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TInt tryCount = 0;
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do
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{
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__UHEAP_MARK;
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__UHEAP_SETFAIL(RHeap::EDeterministic, ++tryCount);
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err = PersistHAL();
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__UHEAP_SETFAIL(RHeap::ENone, 0);
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__UHEAP_MARKEND;
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} while(err == KErrNoMemory);
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TheTest(err==KErrNone);
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TheTest.Printf(_L("- succeeded at heap failure rate of %i\n"), tryCount);
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}
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LOCAL_C void RunTestsL()
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{
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OOMTestInitialiseHAL();
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OOMTestPersistHAL();
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}
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GLDEF_C TInt E32Main()
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{
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__UHEAP_MARK;
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TheTest.Title ();
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TheTest.Start (_L ("OOM Tests"));
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CTrapCleanup* cleanup=CTrapCleanup::New();
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TRAPD(err, ::RunTestsL());
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delete cleanup;
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TheTest.End ();
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TheTest.Close ();
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__UHEAP_MARKEND;
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return err;
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}
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