// Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

/**

 @file

 @test

*/

#ifndef __EGLTEST_STRESS_SGIMAGE_H__

#define __EGLTEST_STRESS_SGIMAGE_H__

#include <VG/openvg.h>

#include <test/egltestcommonstep.h>

#include "egltest_stress_common_sgimage.h"

//Test step names

_LIT(KStressPixmapSurface, "StressPixmapSurface");

_LIT(KStressVGImage, "StressVGImage");

_LIT(KStressReadOnly, "StressReadOnly");

_LIT(KEStressReadWriteSingleImage, "StressReadWriteSingleImage");

_LIT(KStressReadWriteMultiImage, "StressReadWriteMultiImage");

//ini file parameters

_LIT(KPixelFormat, "PixelFormat");

_LIT(KNumberRSgImages, "NumberRSgImages");

_LIT(KNumberChildProcesses, "NumberChildProcesses");

_LIT(KNumberMainImages, "NumberMainImages");

_LIT(KRSgImageWidth, "RSgImageWidth");

_LIT(KRSgImageHeight, "RSgImageHeight");

//default section for sim load app ini file

_LIT(KDefaultSectionName,"default");

//supported pixel formats for these test cases

_LIT(KUidPixelFormatARGB_8888, "PixelFormatARGB_8888");

_LIT(KUidPixelFormatARGB_8888_PRE, "PixelFormatARGB_8888_PRE");

_LIT(KUidPixelFormatRGB_565, "PixelFormatRGB_565");

//Child application

_LIT(KStressTestClientApp, "z:\\sys\\bin\\eglteststressprocesssgimage.exe");

//Panic string

_LIT(KStressTestMainAppPanic, "Stress Test Main App");

_LIT(KStress, "Stress");

NONSHARABLE_CLASS(CEglTest_Stress) : public CEglTestStep

    {

public:

    ~CEglTest_Stress();

    TVerdict doTestStepL();

private:

    void PaintSurfaceL(EGLDisplay aDisplay, EGLSurface aSurface, EGLContext aContext);

    void CreateChildProcessL(TInt aProcessNumber,  TTestType aTestType, TSgDrawableId aDrawableId);

    void CreateChildProcessesL();

    void ClearDownArraysL(EGLDisplay aDisplay);

    void CreateSimLoadAppL();

    void CreateSimLoadProcessL(const TDesC& aApp);

    void DestroySimLoadProcess();

    void ReadIniValueL(const TDesC& aSectName, const TDesC& aKeyName, TInt& aResult);

    void ReadIniValuesL();

    void PrintConfigDataL();

    void DeleteConfigData();

private:

    TPtrC iPixelFormat;

    TInt iNumberRSgImages;

    TInt iNumberChildProcesses;

    TInt iNumberMainImages;

    TInt iRSgImageWidth;

    TInt iRSgImageHeight;

    TInt iSimLoadValue;

    TInt iByteSize;

    TUidPixelFormat iFormat;

    VGImageFormat iVgFormat;

    TBool iAlphaPre;

    TTestType iTestType;

    RArray<RSgImage> iSgImageArray;

    RArray<VGImage> iVGImageArray;

    RArray<EGLSurface> iSurfaceArray;

    RArray<RProcess> iProcessArray;

    RArray<RProcess> iProcessList;

    RFs iFs;

};

class CTReadWriteMain : public CTReadWrite

    {

public:

    static CTReadWriteMain* NewL(EGLDisplay aDisplay, EGLSurface aSurface, EGLContext aContext, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, TBool& aTestPass, TInt& aFinishedCounter, const TTestType& aTestType, VGImage aVGImage = 0);

private:

    CTReadWriteMain(EGLDisplay aDisplay, EGLSurface aSurface, EGLContext aContext, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, TBool& aTestPass, TInt& aFinishedCounter, const TTestType& aTestType);

    void ConstructL(VGImage aVGImage);

    void ReadImageFuncL();

    void ReadFuncL();

    void WriteImageFuncL();

    void VgImageFuncL();

    void MakeCurrentL() const;

    TBool IsFinished();

    void PixmapSurfaceFuncL();

private:

    EGLDisplay iDisplay;

    EGLSurface iSurface;

    EGLContext iContext;

    TInt& iFinishedCounter;

    VGImage iVGImage;

    };

#endif //__EGLTEST_STRESS_SGIMAGE_H__