diff -r 000000000000 -r bde4ae8d615e os/ossrv/genericservices/systemagent/test/rtest/t_haloomtests/t_haloomtests.cpp
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/os/ossrv/genericservices/systemagent/test/rtest/t_haloomtests/t_haloomtests.cpp	Fri Jun 15 03:10:57 2012 +0200
@@ -0,0 +1,114 @@
+// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// For the out of memory test of  HAL initialise/ Persist functions :
+// 
+//
+
+/**
+ @file
+ @internalComponent
+ @test
+*/
+
+#include <e32base.h>
+#include "halfiles.h"
+#include <e32test.h>
+
+LOCAL_D RTest 			TheTest (_L ("OOM Tests"));
+
+/**
+@SYMTestCaseID          SYSLIB-HALSETTINGS-CT-1711
+@SYMTestCaseDesc        OOM Test Initialise HAL attributes
+@SYMTestPriority        Medium
+@SYMTestActions         Tests for the out of memory conditions
+@SYMTestExpectedResults Tests must not fail
+@SYMDEF                 DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out
+*/
+
+LOCAL_C void OOMTestInitialiseHAL()
+		{
+		TheTest.Next(_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1711 OOM test for InitialiseHAL() "));
+		PersistHAL(); // to make sure HAL.DAT is on the system drive
+		TInt err;
+		TInt tryCount = 0;
+		do
+			{
+			__UHEAP_MARK;
+
+			__UHEAP_SETFAIL(RHeap::EDeterministic, ++tryCount);
+			err = InitialiseHAL();
+			__UHEAP_SETFAIL(RHeap::ENone, 0);
+
+			__UHEAP_MARKEND;
+			} while(err == KErrNoMemory);
+
+	 		TheTest(err==KErrNone);
+			TheTest.Printf(_L("- succeeded at heap failure rate of %i\n"), tryCount);
+		}
+/**
+@SYMTestCaseID          SYSLIB-HALSETTINGS-CT-1710
+@SYMTestCaseDesc        OOM Test for Persist HAL attributes
+@SYMTestPriority        Medium
+@SYMTestActions         Tests for the out of memory conditions
+@SYMTestExpectedResults Tests must not fail
+@SYMDEF                 DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out
+*/
+LOCAL_C void OOMTestPersistHAL()
+		{
+		TheTest.Next(_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1710 OOM test for PersistHAL() "));
+
+		TInt err;
+		TInt tryCount = 0;
+		do
+			{
+			__UHEAP_MARK;
+
+			__UHEAP_SETFAIL(RHeap::EDeterministic, ++tryCount);
+			err = PersistHAL();
+			__UHEAP_SETFAIL(RHeap::ENone, 0);
+
+			__UHEAP_MARKEND;
+			} while(err == KErrNoMemory);
+
+	 		TheTest(err==KErrNone);
+			TheTest.Printf(_L("- succeeded at heap failure rate of %i\n"), tryCount);
+		}
+
+
+LOCAL_C void RunTestsL()
+		{
+		OOMTestInitialiseHAL();
+		OOMTestPersistHAL();
+		}
+
+GLDEF_C TInt E32Main()
+	{
+
+	__UHEAP_MARK;
+	TheTest.Title ();
+	TheTest.Start (_L ("OOM Tests"));
+	CTrapCleanup* cleanup=CTrapCleanup::New();
+
+
+	TRAPD(err, ::RunTestsL());
+
+	delete cleanup;
+
+	TheTest.End ();
+	TheTest.Close ();
+	__UHEAP_MARKEND;
+
+	return  err;
+
+	}