diff -r 000000000000 -r bde4ae8d615e os/kernelhwsrv/kerneltest/e32test/usbho/t_usbdi/inc/PBASE-T_USBDI-0483.h --- /dev/null Thu Jan 01 00:00:00 1970 +0000 +++ b/os/kernelhwsrv/kerneltest/e32test/usbho/t_usbdi/inc/PBASE-T_USBDI-0483.h Fri Jun 15 03:10:57 2012 +0200 @@ -0,0 +1,109 @@ +#ifndef __TEST_CASE_PBASE_T_USBDI_0483_H +#define __TEST_CASE_PBASE_T_USBDI_0483_H + +/* +* Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies). +* All rights reserved. +* This component and the accompanying materials are made available +* under the terms of the License "Eclipse Public License v1.0" +* which accompanies this distribution, and is available +* at the URL "http://www.eclipse.org/legal/epl-v10.html". +* +* Initial Contributors: +* Nokia Corporation - initial contribution. +* +* Contributors: +* +* Description: +* @file PBASE-T_USBDI-0483.h +* @internalComponent +* +* +*/ + + + + +#include "BaseTestCase.h" +#include "TestCaseFactory.h" +#include "FDFActor.h" +#include "modelleddevices.h" +#include "controltransferrequests.h" +#include +#include +#include + +namespace NUnitTesting_USBDI + { + +/** + + + @SYMTestCaseID PBASE-T_USBDI-0483 + @SYMTestCaseDesc Large configuration + @SYMFssID + @SYMPREQ 1782 + @SYMREQ Negative testing + @SYMTestType UT + @SYMTestPriority 1 + @SYMTestActions 1. Enumerate + 2. Retrieve configuration descriptor again + 3. Validated + @SYMTestExpectedResults Device connection accepted + @SYMTestStatus Implemented + + +*/ +class CUT_PBASE_T_USBDI_0483 : public CBaseTestCase, public MUsbBusObserver, public MCommandObserver + { +public: + static CUT_PBASE_T_USBDI_0483* NewL(TBool aHostRole); + ~CUT_PBASE_T_USBDI_0483(); + +public: // From MUsbBusObserver + void DeviceInsertedL(TUint aDeviceHandle); + void DeviceRemovedL(TUint aDeviceHandle); + void BusErrorL(TInt aError); + void DeviceStateChangeL(RUsbDevice::TDeviceState aPreviousState,RUsbDevice::TDeviceState aNewState, + TInt aCompletionCode); + +public: // From MCommandObserver + void Ep0TransferCompleteL(TInt aCompletionCode); + +private: + CUT_PBASE_T_USBDI_0483(TBool aHostRole); + void ConstructL(); + void ExecuteHostTestCaseL(); + void ExecuteDeviceTestCaseL(); + void HostDoCancel(); + void DeviceDoCancel(); + void HostRunL(); + void DeviceRunL(); + +private: + enum TCaseStep + { + EInProgress, + EFailed, + EPassed + }; + + CActorFDF* iActorFDF; + RUsbInterface iUsbInterface0; + CEp0Transfer* iControlEp0; + HBufC8* iConfigDescriptorData; + TCaseStep iCaseStep; + // The test device with class-specific descriptors for this test case + RUsbDeviceB* iTestDevice; + +private: + /** + The functor to create this test case from the factory + */ + const static TFunctorTestCase iFunctor; + }; + + } + + +#endif