sl@0: // Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
sl@0: // All rights reserved.
sl@0: // This component and the accompanying materials are made available
sl@0: // under the terms of the License "Eclipse Public License v1.0"
sl@0: // which accompanies this distribution, and is available
sl@0: // at the URL "http://www.eclipse.org/legal/epl-v10.html".
sl@0: //
sl@0: // Initial Contributors:
sl@0: // Nokia Corporation - initial contribution.
sl@0: //
sl@0: // Contributors:
sl@0: //
sl@0: // Description:
sl@0: // f32test/group/t_pagestress.mmp
sl@0: // 
sl@0: //
sl@0: 
sl@0: target			t_pagestress.exe
sl@0: targettype		exe
sl@0: sourcepath		../demandpaging
sl@0: source			loader/t_pageldrtstdll.cia t_pagestress.cpp 
sl@0: library			euser.lib efsrv.lib
sl@0: capability		all
sl@0: macro			DEF_T_PAGESTRESS
sl@0: userinclude		../demandpaging/loader
sl@0: vendorid		0x70000001
sl@0: OS_LAYER_SYSTEMINCLUDE_SYMBIAN
sl@0: userinclude		../demandpaging
sl@0: userinclude		../../e32test/demandpaging
sl@0: pagedcode
sl@0: unpageddata	// todo: otherwise this test's memory use causes it to take a very long time and timeout
sl@0: SMPSAFE