sl@0: #ifndef __TEST_CASE_PBASE_T_USBDI_0483_H
sl@0: #define __TEST_CASE_PBASE_T_USBDI_0483_H
sl@0: 
sl@0: /*
sl@0: * Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
sl@0: * All rights reserved.
sl@0: * This component and the accompanying materials are made available
sl@0: * under the terms of the License "Eclipse Public License v1.0"
sl@0: * which accompanies this distribution, and is available
sl@0: * at the URL "http://www.eclipse.org/legal/epl-v10.html".
sl@0: *
sl@0: * Initial Contributors:
sl@0: * Nokia Corporation - initial contribution.
sl@0: *
sl@0: * Contributors:
sl@0: *
sl@0: * Description:
sl@0: * @file PBASE-T_USBDI-0483.h
sl@0: * @internalComponent
sl@0: * 
sl@0: *
sl@0: */
sl@0: 
sl@0: 
sl@0: 
sl@0:  
sl@0: #include "BaseTestCase.h"
sl@0: #include "TestCaseFactory.h"
sl@0: #include "FDFActor.h"
sl@0: #include "modelleddevices.h"
sl@0: #include "controltransferrequests.h"
sl@0: #include <d32usbc.h>
sl@0: #include <e32debug.h>
sl@0: #include <d32usbdi.h>
sl@0: 
sl@0: namespace NUnitTesting_USBDI
sl@0: 	{
sl@0: 
sl@0: /**
sl@0: 
sl@0: 	
sl@0: 	@SYMTestCaseID				PBASE-T_USBDI-0483
sl@0: 	@SYMTestCaseDesc			Large configuration
sl@0: 	@SYMFssID 
sl@0: 	@SYMPREQ					1782
sl@0: 	@SYMREQ						Negative testing
sl@0: 	@SYMTestType				UT
sl@0: 	@SYMTestPriority			1 
sl@0: 	@SYMTestActions 			1. Enumerate
sl@0:                                 2. Retrieve configuration descriptor again
sl@0:                                 3. Validated
sl@0: 	@SYMTestExpectedResults 	Device connection accepted
sl@0: 	@SYMTestStatus				Implemented
sl@0: 	
sl@0: 
sl@0: */
sl@0: class CUT_PBASE_T_USBDI_0483 : public CBaseTestCase, public MUsbBusObserver, public MCommandObserver
sl@0: 	{
sl@0: public:
sl@0: 	static CUT_PBASE_T_USBDI_0483* NewL(TBool aHostRole);
sl@0: 	~CUT_PBASE_T_USBDI_0483(); 
sl@0: 
sl@0: public: // From MUsbBusObserver
sl@0: 	void DeviceInsertedL(TUint aDeviceHandle);
sl@0: 	void DeviceRemovedL(TUint aDeviceHandle);
sl@0: 	void BusErrorL(TInt aError);
sl@0: 	void DeviceStateChangeL(RUsbDevice::TDeviceState aPreviousState,RUsbDevice::TDeviceState aNewState,
sl@0: 			TInt aCompletionCode);
sl@0: 	
sl@0: public: // From MCommandObserver
sl@0: 	void Ep0TransferCompleteL(TInt aCompletionCode);
sl@0: 	
sl@0: private:
sl@0: 	CUT_PBASE_T_USBDI_0483(TBool aHostRole);
sl@0: 	void ConstructL();
sl@0: 	void ExecuteHostTestCaseL();
sl@0: 	void ExecuteDeviceTestCaseL();
sl@0: 	void HostDoCancel();
sl@0: 	void DeviceDoCancel();
sl@0: 	void HostRunL();
sl@0: 	void DeviceRunL();
sl@0: 
sl@0: private:
sl@0: 	enum TCaseStep
sl@0: 		{
sl@0: 		EInProgress,
sl@0: 		EFailed,
sl@0: 		EPassed
sl@0: 		};
sl@0: 		
sl@0: 	CActorFDF* iActorFDF;
sl@0: 	RUsbInterface iUsbInterface0;
sl@0: 	CEp0Transfer* iControlEp0;
sl@0: 	HBufC8* iConfigDescriptorData;
sl@0: 	TCaseStep iCaseStep; 
sl@0: 	// The test device with class-specific descriptors for this test case
sl@0: 	RUsbDeviceB* iTestDevice;
sl@0: 
sl@0: private:
sl@0: 	/**
sl@0: 	The functor to create this test case from the factory
sl@0: 	*/
sl@0: 	const static TFunctorTestCase<CUT_PBASE_T_USBDI_0483,TBool> iFunctor;
sl@0: 	};
sl@0: 
sl@0: 	}
sl@0: 
sl@0: 
sl@0: #endif