sl@0: // Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
sl@0: // All rights reserved.
sl@0: // This component and the accompanying materials are made available
sl@0: // under the terms of "Eclipse Public License v1.0"
sl@0: // which accompanies this distribution, and is available
sl@0: // at the URL "http://www.eclipse.org/legal/epl-v10.html".
sl@0: //
sl@0: // Initial Contributors:
sl@0: // Nokia Corporation - initial contribution.
sl@0: //
sl@0: // Contributors:
sl@0: //
sl@0: // Description:
sl@0: //
sl@0: 
sl@0: #include "tbitbltmasked.h"
sl@0: 
sl@0: CTBitBltMasked::CTBitBltMasked()
sl@0: 	{
sl@0: 	SetTestStepName(KTDirectGdiBitBltMaskedStep);
sl@0: 	}
sl@0: 
sl@0: CTBitBltMasked::~CTBitBltMasked()
sl@0: 	{
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: Override of base class pure virtual
sl@0: Lists the tests to be run
sl@0: */
sl@0: void CTBitBltMasked::RunTestsL()
sl@0: 	{
sl@0: 	if(iUseDirectGdi && !iUseSwDirectGdi)
sl@0: 		{
sl@0: 		// In the event that a test leaves after a BitBlt() or DrawBitmap() has occurred
sl@0: 		// the vgimage cache will need to be reset.
sl@0: 		// This needs to be the first item on the cleanupstack, 
sl@0: 		// as some tests perform pushes and pops of bitmaps.
sl@0: 		CleanupStack::PushL(TCleanupItem(ResetCache, iVgImageCache));
sl@0: 		}
sl@0: 
sl@0: 	BeginMaskIteration();
sl@0: 	// to minimize tests call number these tests are processed only for one mask
sl@0: 	if(!iLargeTarget)
sl@0: 		{
sl@0: 		SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0003"));
sl@0: 		TestInvalidParametersL();
sl@0: 		RecordTestResultL();
sl@0: 		SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0004"));
sl@0: 		TestSourceBitmapCloningL();
sl@0: 		RecordTestResultL();
sl@0: 		SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0005"));
sl@0: 		TestMaskCloningL();
sl@0: 		RecordTestResultL();
sl@0: 		}
sl@0: 	do
sl@0: 		{
sl@0: 		if(!iLargeTarget)
sl@0: 			{
sl@0: 			iTestParams.iDoCompressed = ETrue;
sl@0: 			SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0001"));
sl@0: 			TestBasicL();
sl@0: 			RecordTestResultL();
sl@0: 			iTestParams.iDoCompressed = EFalse;
sl@0: 			SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0006"));
sl@0: 			TestDrawModeL();			
sl@0: 			RecordTestResultL();
sl@0: 			SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0007"));
sl@0: 			TestWithSameBitmapsL();
sl@0: 			RecordTestResultL();
sl@0: 			SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0008"));
sl@0: 			TestSetOriginL();
sl@0: 			RecordTestResultL();
sl@0: 			}
sl@0: 		else
sl@0: 			{
sl@0: 			SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0002"));
sl@0: 			TestPositioningL();
sl@0: 			RecordTestResultL();
sl@0: 			}
sl@0: 		}
sl@0: 	while(NextMaskIteration());
sl@0: 
sl@0: 	if(iUseDirectGdi && !iUseSwDirectGdi)
sl@0: 		{
sl@0: 		CleanupStack::PopAndDestroy(iVgImageCache);
sl@0: 		}
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0001
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9198
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Bit blitting with masking basic functionality.
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions 	
sl@0: 	Test bit blitting with masking for basic and valid parameters.
sl@0: 	
sl@0: @SYMTestExpectedResults 
sl@0: 	Source bitmap should be copied into target area. Basic or inverted
sl@0: 	masking should be considered. Valid bitmap should be created. This
sl@0: 	bitmap should be the same as a reference bitmap.
sl@0: */
sl@0: void CTBitBltMasked::TestBasicL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-Basic"); 
sl@0: 	_LIT(KTestNameNegative, "BitBltMasked-Basic-NegativeMaskPosition");	
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 
sl@0: 	ResetGc();
sl@0: 	CFbsBitmap* bitmap;
sl@0: 	CFbsBitmap* mask;
sl@0: 	if(iTestParams.iDoCompressed)
sl@0: 		{
sl@0: 		bitmap = iCompressedBitmap;
sl@0: 		mask = iCompressedMaskL8;
sl@0: 		}
sl@0: 	else
sl@0: 		{
sl@0: 		bitmap = iCheckedBoardBitmap2;
sl@0: 		mask = iCurrentMask1;
sl@0: 		}
sl@0: 	
sl@0: 	TRect bmpRect(TPoint(0, 0), bitmap->SizeInPixels());	
sl@0: 	if(iMaskPixelFormat == EUidPixelFormatL_1)
sl@0: 		{
sl@0: 		iGc->BitBltMasked(TPoint(20, 20), *bitmap, bmpRect, *mask, iInvertMask);
sl@0: 		iGc->BitBltMasked(TPoint(20, 20), *bitmap, bmpRect, *mask, ETrue);
sl@0: 		}
sl@0: 	else
sl@0: 		{
sl@0: 		iGc->BitBltMasked(TPoint(20, 20), *bitmap, bmpRect, *mask, TPoint(0, 0));
sl@0: 		}
sl@0: 	TESTNOERROR(iGc->GetError());
sl@0: 	if(!iTestParams.iDoCompressed)
sl@0: 		WriteTargetOutput(KTestName());
sl@0: 	
sl@0: 	// negative mask position
sl@0: 	iGc->BitBltMasked(TPoint(-35, 180), *bitmap, bmpRect, *iMask1L8, TPoint(-1, -1));
sl@0: 	TESTNOERROR(iGc->GetError());	
sl@0: 	
sl@0: 	// mask position greater than mask size
sl@0: 	iGc->BitBltMasked(TPoint(-35, 200), *bitmap, bmpRect, *iMask1L8, iMask1L8->SizeInPixels().AsPoint());
sl@0: 	CheckErrorsL(KErrNone, KErrArgument, (TText8*)__FILE__, __LINE__);
sl@0: 	
sl@0: 	if(!iTestParams.iDoCompressed)
sl@0: 		TESTNOERRORL(WriteTargetOutput(KTestNameNegative()));
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0002
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9197
sl@0: 	REQ9198
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Various combinations of destination positions, source position and size
sl@0:  	of a bitmap are tested. Test also covers mask alignment, tiling and boundary
sl@0:  	parameters.
sl@0:  	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions
sl@0: 	Covers the whole target bitmap starting from TPoint(-30,-30) with staggered blits of a small 8x8 bitmap. 	
sl@0: 	Test positioning functionality of BitBltMasked() methods. Test boundary
sl@0:  	conditions, tiling and clipping to surface area.
sl@0:  	
sl@0: @SYMTestExpectedResults 
sl@0: */
sl@0: void CTBitBltMasked::TestPositioningL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-Positioning"); 
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 	iTestParams.iDoCompressed = ETrue;
sl@0: 	TestPositioningBaseL(KTestName(), EBitBltMasked);
sl@0: 	iTestParams.iDoCompressed = EFalse;
sl@0: 	TestPositioningBaseL(KTestName(), EBitBltMasked);
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0003
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9197
sl@0: 	REQ9198
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Calling BitBltMasked() method with invalid parameters
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions 	
sl@0: 	Invalid source rect:
sl@0: 		- TRect(-30, -30, -10, -10);
sl@0: 		- TRect(bmpWidth+10, bmpHeight+10, bmpWidth+20, bmpHeight+20);
sl@0: 		- TRect(bmpWidth, bmpHeight, 0, 0);
sl@0: 		- TRect(-10, -10, -30, -30);
sl@0: 		- TRect(0, 0, 0, 0);
sl@0: 	Invalid mask (aMaskBitmap):
sl@0: 		- zero size mask
sl@0: 		- not initialized mask
sl@0: 	Mask position greater than mask size: aMaskPt = TPoint(mask_width, mask_height)
sl@0:     Invalid source bitmap:
sl@0: 		- zero size bitmap
sl@0:         - not initialised bitmap
sl@0: 
sl@0: @SYMTestExpectedResults 
sl@0: 	Function should detect invalid parameters and return. Nothing should be drawn
sl@0:  	in a target area.
sl@0: */
sl@0: void CTBitBltMasked::TestInvalidParametersL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-InvalidParameters"); 
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 	TestInvalidParametersBaseL(KTestName(), EBitBltMasked);
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0004
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9197
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Tests that masked bitmaps are drawn correctly if they 
sl@0: 	are deleted immediately after BitBltMasked() is called, but before Finish() is called.
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions 	
sl@0: 	Set valid mask parameters (see BitBltMasked-Basic).
sl@0: 	For test description see BitBlt-SourceBitmapCloning.
sl@0: 	 
sl@0: @SYMTestExpectedResults 
sl@0: 	Source bitmap should be copied into target area. Memory leaks should not
sl@0:  	be created. Valid bitmap should be created. This bitmap should be
sl@0:  	the same as a reference bitmap.
sl@0: */
sl@0: void CTBitBltMasked::TestSourceBitmapCloningL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-SourceBitmapCloning"); 
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 	iTestParams.iDoCompressed = ETrue;
sl@0: 	TestSourceBitmapCloningBaseL(KTestName(), EBitBltMasked);
sl@0: 	iTestParams.iDoCompressed = EFalse;	
sl@0: 	TestSourceBitmapCloningBaseL(KTestName(), EBitBltMasked);
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0005
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9197
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Tests that masked bitmaps are drawn correctly if the mask 
sl@0: 	is deleted immediately after BitBltMasked() is called, but before Finish() is called.
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 
sl@0: @SYMTestActions 	
sl@0: 	1. Invoke the BitBltMasked() method with valid parameters (see BitBltMasked-Basic). 
sl@0: 	2. Right after returning from BitBltMasked() call, destroy the source mask (aMaskBitmap).
sl@0: 	3. Call the BitBltMasked() method again with the same mask parameter.
sl@0: 	Repeat  p. 1-3 a few times.
sl@0: 	
sl@0: @SYMTestExpectedResults 
sl@0: 	Source bitmap should be copied into target area and should be correctly masked.
sl@0:  	Memory leaks should not be created. Valid bitmap should be created. This bitmap
sl@0:  	should be the same as a reference bitmap.
sl@0: */	
sl@0: void CTBitBltMasked::TestMaskCloningL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-MaskCloning"); 
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 	iTestParams.iDoCompressed = ETrue;
sl@0: 	TestMaskCloningBaseL(KTestName(), EBitBltMasked);
sl@0: 	iTestParams.iDoCompressed = EFalse;
sl@0: 	TestMaskCloningBaseL(KTestName(), EBitBltMasked);
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0006
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9198
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Test correctness of bit blitting with mask in all possible draw modes.
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions 	
sl@0: 	Set valid parameters (see BitBltMasked-Basic).
sl@0: 	Use the semi-transparent source bitmap (iCheckedBoardWithAlphaBitmap).
sl@0: 	Set drawmode to EDrawModePEN and call the methods.
sl@0: 	Set drawmode to EDrawModeWriteAlpha and call the methods.
sl@0: 	
sl@0: @SYMTestExpectedResults 
sl@0: 	Semi-transparent (for  EDrawModePEN) and opaque (for  EDrawModeWriteAlpha)
sl@0:  	should be copied into rendering target. Valid bitmap should be created.
sl@0:  	This bitmap should be the same as a reference bitmap.
sl@0: */
sl@0: void CTBitBltMasked::TestDrawModeL()
sl@0: 	{
sl@0: 	_LIT(KTestName, "BitBltMasked-DrawMode"); 
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 	ResetGc();
sl@0: 
sl@0: 	TSize bmpSize(iCheckedBoardWithAlphaBitmap->SizeInPixels());
sl@0: 
sl@0: 	TInt halfHeight = (bmpSize.iHeight  >> 1);	
sl@0: 	TInt quarterWidth  = (bmpSize.iWidth  >> 2);
sl@0: 	TInt y1 = halfHeight - (bmpSize.iHeight >> 2);	
sl@0: 	TSize vertRectSize  (quarterWidth, bmpSize.iHeight);
sl@0: 	TSize horizRectSize (bmpSize.iWidth, halfHeight);
sl@0: 
sl@0: 	// EDrawModeWriteAlpha is not supported in the following modes
sl@0: 	// This is tested under invalid parameter tests.
sl@0: 	if (!((iMaskPixelFormat == EUidPixelFormatL_8) && 
sl@0: 		  ((iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888) ||
sl@0: 		   (iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888_PRE))))
sl@0: 		{
sl@0: 		// Render column to left
sl@0: 		iGc->SetDrawMode(DirectGdi::EDrawModeWriteAlpha);
sl@0: 		iGc->BitBltMasked(
sl@0: 			TPoint(0, 0),
sl@0: 			*iCheckedBoardWithAlphaBitmap,
sl@0: 			TRect(TPoint(0, 0), vertRectSize), 
sl@0: 			*iCurrentMask2, 
sl@0: 			TPoint(0, 0));
sl@0: 		}
sl@0: 
sl@0: 	// Render row in center
sl@0: 	iGc->SetDrawMode(DirectGdi::EDrawModePEN);
sl@0: 	iGc->BitBltMasked(
sl@0: 		TPoint(0, y1), 
sl@0: 		*iCheckedBoardWithAlphaBitmap, 
sl@0: 		TRect(TPoint(0, 0), horizRectSize),
sl@0: 		*iCurrentMask2, 
sl@0: 		TPoint(0, 0));
sl@0: 	
sl@0: 	// EDrawModeWriteAlpha is not supported in the following modes
sl@0: 	// This is tested under invalid parameter tests.
sl@0: 	if (!((iMaskPixelFormat == EUidPixelFormatL_8) && 
sl@0: 		  ((iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888) ||
sl@0: 		   (iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888_PRE))))
sl@0: 		{
sl@0: 		// Render column to right
sl@0: 		iGc->SetDrawMode(DirectGdi::EDrawModeWriteAlpha);
sl@0: 		iGc->BitBltMasked(
sl@0: 			TPoint(bmpSize.iWidth - quarterWidth, 0),
sl@0: 			*iCheckedBoardWithAlphaBitmap,
sl@0: 			TRect(TPoint(0, 0), vertRectSize), 
sl@0: 			*iCurrentMask2, 
sl@0: 			TPoint(0, 0));
sl@0: 		}
sl@0: 	
sl@0: 	TESTNOERRORL(iGc->GetError());
sl@0: 
sl@0: 	TESTNOERRORL(WriteTargetOutput(KTestName()));
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0007
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9198
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Test the basic functionality of bit blitting with masking.
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions 	
sl@0: 	Test bit blitting with masking for same source and mask bitmaps.
sl@0: 	
sl@0: @SYMTestExpectedResults 
sl@0: 	Source bitmap should be copied into target area. Basic or inverted
sl@0:  	masking should be considered. Valid bitmap should be created. This
sl@0:  	bitmap should be the same as a reference bitmap.
sl@0: */
sl@0: void CTBitBltMasked::TestWithSameBitmapsL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-SameBitmaps"); 
sl@0: 	ResetGc();
sl@0: 	TRect bmpRect1(TPoint(0, 0), iBlackWhiteBitmap->SizeInPixels());
sl@0: 	iGc->SetOrigin(TPoint(30, 30));
sl@0: 	iGc->BitBltMasked(TPoint(0, 0), *iBlackWhiteBitmap, bmpRect1, *iBlackWhiteBitmap, ETrue);
sl@0: 	iGc->BitBltMasked(TPoint(0, 0), *iBlackWhiteBitmap, bmpRect1, *iBlackWhiteBitmap, EFalse);
sl@0: 	TESTNOERRORL(iGc->GetError());
sl@0: 	//Write target only if image is not empty. BitGDI is producing white images when Mask pixel format is EUidPixelFormatL_8 
sl@0: 	TBool pass = TestTargetL(KRgbWhite);
sl@0: 	if(!pass)
sl@0: 		{		
sl@0: 		TESTNOERRORL(WriteTargetOutput(KTestName()));
sl@0: 		}	
sl@0: 	}
sl@0: 
sl@0: /**
sl@0: @SYMTestCaseID  	
sl@0: 	GRAPHICS-DIRECTGDI-BITBLTMASKED-0008
sl@0: 	
sl@0: @SYMPREQ 			
sl@0: 	PREQ39
sl@0: 
sl@0: @SYMREQ
sl@0: 	REQ9198
sl@0: 	REQ9204 
sl@0: 	REQ9195
sl@0: 	REQ9201 
sl@0: 	REQ9202 
sl@0: 	REQ9222 
sl@0: 	REQ9223 
sl@0: 	REQ9236 
sl@0: 	REQ9237
sl@0: 	
sl@0: @SYMTestCaseDesc	
sl@0: 	Test that BitBltMasked() performs correctly when it is called after SetOrigin().
sl@0: 	
sl@0: @SYMTestPriority	
sl@0: 	Critical
sl@0: 	
sl@0: @SYMTestStatus 		
sl@0: 	Implemented
sl@0: 	
sl@0: @SYMTestActions 	
sl@0: 	Call SetOrigin().
sl@0: 	Call BitBltMasked().
sl@0: 	
sl@0: @SYMTestExpectedResults 
sl@0: 	Source bitmap should be copied into target area. Basic or inverted
sl@0: 	masking should be considered. Valid bitmap should be created. This
sl@0: 	bitmap should be the same as a reference bitmap.
sl@0: */
sl@0: void CTBitBltMasked::TestSetOriginL()
sl@0: 	{	
sl@0: 	_LIT(KTestName, "BitBltMasked-SetOrigin"); 
sl@0: 	_LIT(KTestNameNegative, "BitBltMasked-SetOrigin-NegativeMaskPosition");
sl@0: 	
sl@0: 	// Only do test for one pixel format to cut down on the number of images produced
sl@0: 	// as this is just a positional test and we don't need to test for all pixel formats.
sl@0: 	if (!((iTestParams.iTargetPixelFormat == EUidPixelFormatRGB_565) && (iTestParams.iSourcePixelFormat == EUidPixelFormatRGB_565)))
sl@0: 		{
sl@0: 		return;
sl@0: 		}
sl@0: 				
sl@0: 	if(!iRunningOomTests)
sl@0: 		{
sl@0: 		INFO_PRINTF1(KTestName);
sl@0: 		}
sl@0: 
sl@0: 	ResetGc();
sl@0: 	CFbsBitmap* bitmap = iCheckedBoardBitmap2;
sl@0: 	CFbsBitmap* mask = iCurrentMask1;	
sl@0: 	
sl@0: 	TRect bmpRect(TPoint(0, 0), bitmap->SizeInPixels());
sl@0: 	iGc->SetOrigin(TPoint(-35, 80));
sl@0: 	if(iMaskPixelFormat == EUidPixelFormatL_1)
sl@0: 		{
sl@0: 		iGc->BitBltMasked(TPoint(55, -60), *bitmap, bmpRect, *mask, iInvertMask);
sl@0: 		iGc->BitBltMasked(TPoint(55, -60), *bitmap, bmpRect, *mask, ETrue);
sl@0: 		}
sl@0: 	else
sl@0: 		{
sl@0: 		iGc->BitBltMasked(TPoint(55, -60), *bitmap, bmpRect, *mask, TPoint(0, 0));
sl@0: 		}
sl@0: 	TESTNOERROR(iGc->GetError());	
sl@0: 	TESTNOERRORL(WriteTargetOutput(KTestName()));
sl@0: 	
sl@0: 	// negative mask position
sl@0: 	iGc->BitBltMasked(TPoint(0, 100), *bitmap, bmpRect, *iMask1L8, TPoint(-1, -1));
sl@0: 	TESTNOERROR(iGc->GetError());	
sl@0: 	
sl@0: 	// mask position greater than mask size
sl@0: 	iGc->BitBltMasked(TPoint(0, 120), *bitmap, bmpRect, *iMask1L8, iMask1L8->SizeInPixels().AsPoint());
sl@0: 	CheckErrorsL(KErrNone, KErrArgument, (TText8*)__FILE__, __LINE__);
sl@0: 		
sl@0: 	TESTNOERRORL(WriteTargetOutput(KTestNameNegative()));
sl@0: 	}
sl@0: 
sl@0: