// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of the License "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 // @internalComponent

 // 

 //

 #ifndef TESTCASE1233_H

 #define TESTCASE1233_H

 //----------------------------------------------------------------------------------------------		

 //! @SYMTestCaseID				PBASE-T_OTGDI-1233

 //! @SYMTestCaseDesc			Exercise all VID/PID pairs for High-Speed Electrical Test

 //! @SYMFssID 

 //! @SYMPREQ					

 //! @SYMREQ						

 //! @SYMTestType				UT

 //! @SYMTestPriority			1 

 //! @SYMTestActions 			This test utilises the USB HOST/OTG stack which handles the 

 //!								Host side of detection of a Device attachment where the Device  

 //!								exposes itself as one of the USB High-Speed test device pairs of  

 //!								VID/PID. 

 //!								 

 //!								The applicable VID/PID pairs are shown on the Host end by logging,  

 //!								and the end result is confirmed by user interaction with the T_OTGDI  

 //!								program. 

 //!								 

 //!								The program runs as a back-to-back H4 pair: 

 //!								 

 //!								t_otgdi /slave      is used on the 'A' connected default-Host side 

 //!								t_otgdi /master  is used on the 'B' connected default-Peripheral side 

 //!								 

 //!								To activate this test, select the menu item that access test  

 //!								PBASE-USB_T_OTGDI-1233 (at 24/10/2008 this was selector 26) 

 //!								 

 //!								The VID/PID pairs are as defined in the OTG Supplement (v1.3)  

 //!								section 6.6.6.1 (table 6-5) and are: 

 //!								 

 //!								0x1A0A/0x0101 

 //!								0x1A0A/0x0102 

 //!								0x1A0A/0x0103 

 //!								0x1A0A/0x0104 

 //!								0x1A0A/0x0105 

 //!								0x1A0A/0x0106 

 //!								0x1A0A/0x0107 

 //!								0x1A0A/0x0108 

 //!								 

 //!								NB: since this runs on an H4, which does not provide High-Speed support,  

 //!								the linkage down to hardware is not implemented: instead, the test  

 //!								relies on recording the appropriate test routing.

 //!

 //! @SYMTestExpectedResults 	

 //! @SYMTestStatus              Defined	

 //----------------------------------------------------------------------------------------------	

 	class CTestCase1233 : public CTestCaseB2BRoot

 	{

 public:

 	static CTestCase1233* NewL(TBool aHost);

 	virtual ~CTestCase1233(); 	

 	virtual void ExecuteTestCaseL();

 	void DoCancel();

 	static void CancelKB(CTestCaseRoot *pThis);

 	void RunStepL();

 	TInt GetStepIndex()	{ return(iCaseStep); };	

 private:

 	CTestCase1233(TBool aHost);

 	void ConstructL();

 	// DATA

 private:		

 	enum TCaseSteps

 		{

 		// Fixed steps

 		EPreconditions,

 		ELoadLdd,

 		// Steps for this test case only

 		ELoopToNextPID,

 		ERaiseVBus,

 		EVBusRaised,

 		EDropVBus,

 		EVBusDropped,

 		// Fixed steps

 		EUnloadLdd,

 		ELastStep

 		};

 	TCaseSteps iCaseStep;

 	TInt	   iTestVID;

 	TInt	   iTestPID;

 	const static TTestCaseFactoryReceipt<CTestCase1233> iFactoryReceipt;

 	};

 #endif // TESTCASE1233_H