// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of the License "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 // \f32test\loader\t_import_ldd.cpp

 // 

 //

 #define __E32TEST_EXTENSION__

 #include <e32test.h>

 #include "d_export.h"

 #include "d_import.h"

 static RTest test(_L("t_import_ldd"));

 TInt E32Main()

 	{

 	test.Title();

 	test.Start(_L("Testing ldd importing"));

 	test.Next(_L("Load the exporting ldd"));

 	TInt r=User::LoadLogicalDevice(KExportTestLddName);

 	test_Equal(KErrNone, r);	// Don't allow KErrAlreadyExists as don't want ldd to be XIP.

 	RExportLdd exportLdd;

 	test_KErrNone(exportLdd.Open());

 	// The exported function multiplies the 2 arguments.

 	test_Equal(12, exportLdd.RunExport(3, 4));

 	test.Next(_L("Load the importing ldd"));

 	r=User::LoadLogicalDevice(KImportTestLddName);

 	test_Equal(KErrNone, r);	// Don't allow KErrAlreadyExists as don't want ldd to be XIP.

 	RImportLdd importLdd;

 	test_KErrNone(importLdd.Open());

 	// The imported function multiplies the 2 arguments.

 	test_Equal(12, importLdd.RunImport(3, 4));

 	exportLdd.Close();

 	importLdd.Close();

 	test_KErrNone(User::FreeLogicalDevice(KExportTestLddName));

 	test_KErrNone(User::FreeLogicalDevice(KImportTestLddName));

 	test.End();

 	return KErrNone;

     }