First public contribution.
1 // Copyright (c) 1996-2009 Nokia Corporation and/or its subsidiary(-ies).
2 // All rights reserved.
3 // This component and the accompanying materials are made available
4 // under the terms of "Eclipse Public License v1.0"
5 // which accompanies this distribution, and is available
6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".
8 // Initial Contributors:
9 // Nokia Corporation - initial contribution.
19 @internalComponent - Internal Symbian test code
27 #include "../tlib/testbase.h"
29 #include "TGraphicsHarness.h"
31 class CTScreenDevice : public CTWsGraphicsBase
34 CTScreenDevice(CTestStep* aStep);
37 void TestTwipPixelConversions();
38 void TestTwipPixelOverflow();
39 void TwipsCacheFlushL();
40 void CheckBitmapL(CFbsBitmap *aBitmap, const TRect &aRect);
41 void TestScreenToBitmap();
43 virtual void RunTestCaseL(TInt aCurTestCase);
45 void doTestScreenToBitmapL();
48 class CTScreenDeviceStep : public CTGraphicsStep
54 virtual CTGraphicsBase* CreateTestL();
57 class CCachePanic : public CBase
65 void ConstructL(TInt aScreenNumber, TInt aInt);
66 static TInt DoTest(CCachePanic* aTestClass);
70 CWsScreenDevice* iWsScrDev;
75 class CTwipsPanic : public CCachePanic
78 static TInt RunTest(TInt aInt, TAny* aPtr);
84 class CScanLinePanic : public CCachePanic
87 enum ScanLineTestCases
89 TESTCASE_GRAPHICS_WSERV_0473 = 0,
90 TESTCASE_GRAPHICS_WSERV_0474
93 static TInt RunTest(TInt aInt, TAny* aPtr);
98 // Methods for test cases go here
100 void TestLengthInvariant();
101 void TestBufferInvariant();
105 _LIT(KTScreenDeviceStep,"TScreenDevice");