// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of the License "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 // Global configuration for the tests

 // 

 //

 #ifndef UTL_H

 #define UTL_H

 #include <e32test.h>

 GLREF_D RTest test;

 #define TEST_FOR_ERROR( r )	__testForError( r, __LINE__, __FILE__ )

 #define __testForError(x,l,f) testForError(x,l,_S(f))

 _LIT( KErrorFailString, "Test failed with error %d");

 inline void testForError( TInt aCode, TInt aLine, const TText* aFileName )

 	{

 	if( aCode != KErrNone )

 		{

 		test.Printf( KErrorFailString, aCode );

 		test.operator()( EFalse, aLine, aFileName );

 		}

 	}

 #define TEST_FOR_MATCH( r, m ) __testForMatch( (TUint)(r), (TUint)(m), __LINE__, __FILE__ )

 #define __testForMatch(r,m,l,f) testForMatch(r,m,l,_S(f))

 _LIT( KMatchFailString, "Test failed, expected %d; got %d");

 inline void testForMatch( TUint aValue, TUint aExpected, TInt aLine, const TText* aFileName )

 	{

 	if( aValue != aExpected )

 		{

 		test.Printf( KMatchFailString, aExpected, aValue );

 		test.operator()( EFalse, aLine, aFileName );

 		}

 	}

 #endif