Update contrib.
1 #ifndef __TEST_CASE_PBASE_T_USBDI_0500_H
2 #define __TEST_CASE_PBASE_T_USBDI_0500_H
5 * Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
7 * This component and the accompanying materials are made available
8 * under the terms of the License "Eclipse Public License v1.0"
9 * which accompanies this distribution, and is available
10 * at the URL "http://www.eclipse.org/legal/epl-v10.html".
12 * Initial Contributors:
13 * Nokia Corporation - initial contribution.
18 * @file PBASE-T_USBDI-0500.h
27 #include "BaseBulkTestCase.h"
30 namespace NUnitTesting_USBDI
35 @SYMTestCaseID PBASE-T_USBDI-0500
36 @SYMTestCaseDesc Test resilience to halting an endpoint whilst performing a bulk IN transfer
39 @SYMREQ 7055 [USBD : Bulk transfers]
42 @SYMTestActions 1. Open interfaces to connected device
43 2. Request bulk IN transfer
44 3. Client halts endpoint
45 4. Host clears halt on endpoint (via control transfer request)
46 5. Request second bulk IN transfer
47 6. Validate data from second bulk IN transfer.
48 @SYMTestExpectedResults Round trip transfer data is not corrupt
54 class CUT_PBASE_T_USBDI_0500 : public CBaseBulkTestCase,
55 public MTransferObserver,
56 public MCommandObserver
60 static CUT_PBASE_T_USBDI_0500* NewL(TBool aHostRole);
61 ~CUT_PBASE_T_USBDI_0500();
63 public: // From MUsbBusObserver
64 void DeviceInsertedL(TUint aDeviceHandle);
66 public: // From MCommandObserver
67 void Ep0TransferCompleteL(TInt aCompletionCode);
69 public: // From MTransferObserver
70 void TransferCompleteL(TInt aTransferId,TInt aCompletionCode);
73 CUT_PBASE_T_USBDI_0500(TBool aHostRole);
91 The functor for this test case
93 const static TFunctorTestCase<CUT_PBASE_T_USBDI_0500,TBool> iFunctor;