Update contrib.
1 #ifndef __TEST_CASE_PBASE_T_USBDI_0497_H
2 #define __TEST_CASE_PBASE_T_USBDI_0497_H
5 * Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
7 * This component and the accompanying materials are made available
8 * under the terms of the License "Eclipse Public License v1.0"
9 * which accompanies this distribution, and is available
10 * at the URL "http://www.eclipse.org/legal/epl-v10.html".
12 * Initial Contributors:
13 * Nokia Corporation - initial contribution.
18 * @file PBASE-T_USBDI-0497.h
27 #include "BaseBulkTestCase.h"
30 namespace NUnitTesting_USBDI
32 const TUint8 KNumOutTransfersPerInterface = 2; //number of queued OUT transfers in used for each interface
33 const TUint8 KNumInTransfersPerInterface = 2; //number of queued IN transfers used for each interface
38 @SYMTestCaseID PBASE-T_USBDI-0497
39 @SYMTestCaseDesc Test use of multiple bulk transfers doing a round trip on two interfaces
42 @SYMREQ 7055 [USBD : Bulk transfers]
45 @SYMTestActions 1. Open interfaces to connected device
46 2. Queue two bulk OUT transfer requests on each interface
47 3. On completion of OUT transfers queue two bulk IN transfer requests on each interface
48 4. Validate round trip data
49 5. Compare completion times for each bulk transfer
50 @SYMTestExpectedResults Round trip transfer data is not corrupt
56 class CUT_PBASE_T_USBDI_0497 : public CBaseBulkTestCase,
57 public MTransferObserver,
58 public MCommandObserver
62 static CUT_PBASE_T_USBDI_0497* NewL(TBool aHostRole);
63 ~CUT_PBASE_T_USBDI_0497();
65 public: // From MUsbBusObserver
66 void DeviceInsertedL(TUint aDeviceHandle);
68 public: // From MCommandObserver
69 void Ep0TransferCompleteL(TInt aCompletionCode);
71 public: // From MTransferObserver
72 void TransferCompleteL(TInt aTransferId,TInt aCompletionCode);
75 CUT_PBASE_T_USBDI_0497(TBool aHostRole);
87 ERequestDeviceWriteBack,
91 // Transfer objects - use specific names for this test
92 CBulkTransfer* iIfc1InTransfer[KNumInTransfersPerInterface];
93 CBulkTransfer* iIfc1OutTransfer[KNumOutTransfersPerInterface];
95 CBulkTransfer* iIfc2InTransfer[KNumInTransfersPerInterface];
96 CBulkTransfer* iIfc2OutTransfer[KNumOutTransfersPerInterface];
102 The functor for this test case
104 const static TFunctorTestCase<CUT_PBASE_T_USBDI_0497,TBool> iFunctor;