Update contrib.
1 #ifndef __TEST_CASE_PBASE_T_USBDI_0492_H
2 #define __TEST_CASE_PBASE_T_USBDI_0492_H
5 * Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
7 * This component and the accompanying materials are made available
8 * under the terms of the License "Eclipse Public License v1.0"
9 * which accompanies this distribution, and is available
10 * at the URL "http://www.eclipse.org/legal/epl-v10.html".
12 * Initial Contributors:
13 * Nokia Corporation - initial contribution.
18 * @file PBASE-T_USBDI-0492.h
27 #include "BaseBulkTestCase.h"
30 namespace NUnitTesting_USBDI
35 @SYMTestCaseID PBASE-T_USBDI-0492
36 @SYMTestCaseDesc Test use of multiple bulk transfers
39 @SYMREQ 7055 [USBD : Bulk transfers]
42 @SYMTestActions 1. Open interfaces to connected device
43 2. Request three bulk OUT transfers
44 3. Request three bulk IN transfers (expecting data just transferred to peripheral to be sent back)
45 4. Validate round trip data
46 @SYMTestExpectedResults Round trip transfer data is not corrupt
52 class CUT_PBASE_T_USBDI_0492 : public CBaseBulkTestCase,
53 public MTransferObserver,
54 public MCommandObserver
58 static CUT_PBASE_T_USBDI_0492* NewL(TBool aHostRole);
59 ~CUT_PBASE_T_USBDI_0492();
61 public: // From MUsbBusObserver
62 void DeviceInsertedL(TUint aDeviceHandle);
64 public: // From MCommandObserver
65 void Ep0TransferCompleteL(TInt aCompletionCode);
67 public: // From MTransferObserver
68 void TransferCompleteL(TInt aTransferId,TInt aCompletionCode);
71 CUT_PBASE_T_USBDI_0492(TBool aHostRole);
89 The functor for this test case
91 const static TFunctorTestCase<CUT_PBASE_T_USBDI_0492,TBool> iFunctor;