Update contrib.
1 // Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
2 // All rights reserved.
3 // This component and the accompanying materials are made available
4 // under the terms of the License "Eclipse Public License v1.0"
5 // which accompanies this distribution, and is available
6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".
8 // Initial Contributors:
9 // Nokia Corporation - initial contribution.
18 #ifndef TESTCASE0466_H
19 #define TESTCASE0466_H
24 //----------------------------------------------------------------------------------------------
25 //! @SYMTestCaseID PBASE-T_OTGDI-0466
26 //! @SYMTestCaseDesc VBus errors.
31 //! @SYMTestPriority 1
32 //! @SYMTestActions 1. Apply a dummy Load using the OET of 450 Ohm so that IBus > 8mA
34 //! 3. Remove the dummy load via the OET board. Retrieve error event from error callback
36 //! @SYMTestExpectedResults 1. Initial value for VBus > 4.4 and <5.25 volts
37 //! Between steps 2 and 3, we expect to see an error event, with value EMessageVbusProblem
38 //! 4. Value for VBus < 0.2v
39 //----------------------------------------------------------------------------------------------
41 class CTestCase0466 : public CTestCaseRoot
44 static CTestCase0466* NewL(TBool aHost);
45 virtual ~CTestCase0466();
47 virtual void ExecuteTestCaseL();
51 virtual void DescribePreconditions();
52 TInt GetStepIndex() { return(iCaseStep); };
54 static void CancelDrive(CTestCaseRoot *pThis);
57 CTestCase0466(TBool aHost);
65 TInt iRepeats; // loop counter,
71 EDriveBus, // QueueOtgEventRequest( event, status );
79 CTestCaseWatchdog *iWDTimer;
81 const static TTestCaseFactoryReceipt<CTestCase0466> iFactoryReceipt;
86 #endif // TESTCASE0466_H