// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

 // All rights reserved.

 // This component and the accompanying materials are made available

 // under the terms of the License "Eclipse Public License v1.0"

 // which accompanies this distribution, and is available

 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

 //

 // Initial Contributors:

 // Nokia Corporation - initial contribution.

 //

 // Contributors:

 //

 // Description:

 // @internalComponent

 // 

 //

 #ifndef TESTCASE0464_H

 #define TESTCASE0464_H

 //----------------------------------------------------------------------------------------------		

 //! @SYMTestCaseID				KPBASE-T_OTGDI-0464

 //! @SYMTestCaseDesc			VBus drive and drop.

 //! @SYMFssID 

 //! @SYMPREQ					1782

 //! @SYMREQ						7080

 //! @SYMTestType				UT

 //! @SYMTestPriority			1 

 //! @SYMTestActions 			1. Load LDD and start stack

 //! 							2. raise Vbus

 //! 							3. wait for confirmation input (7 seconds)

 //! 							4. drop vBus

 //! 							5. wait for confirmation manual input (7 sec)

 //! 							6. end test

 //! @SYMTestExpectedResults 	1. user input at step 3 and 5 is a 'Y' to indicate 

 //!                                5V and 0V measured at each occasion

 //----------------------------------------------------------------------------------------------		

 	class CTestCase0464 : public CTestCaseRoot

 	{

 public:

 	static CTestCase0464* NewL(TBool aHost);

 	virtual ~CTestCase0464(); 	

 	virtual void ExecuteTestCaseL();

 	void DoCancel();

 	static void CancelKB(CTestCaseRoot *pThis);

 	void RunStepL();

 	virtual void DescribePreconditions();

 	TInt GetStepIndex()	{ return(iCaseStep); };

 private:

 	CTestCase0464(TBool aHost);

 	void ConstructL();

 	// DATA

 public:

 private:	

 	enum TCaseSteps

 		{

 		EPreconditions,

 		ELoadLdd,

 		EDriveBus,	

 		EUnloadLdd,

 		EVerifyVBusGone,

 		ELastStep	

 		};

 	TCaseSteps iCaseStep;

 	const static TTestCaseFactoryReceipt<CTestCase0464> iFactoryReceipt;

 	};

 #endif // TESTCASE0464_H