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/*
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* Copyright (c) 2001-2009 Nokia Corporation and/or its subsidiary(-ies).
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* All rights reserved.
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* This component and the accompanying materials are made available
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* under the terms of the License "Eclipse Public License v1.0"
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* which accompanies this distribution, and is available
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* at the URL "http://www.eclipse.org/legal/epl-v10.html".
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*
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* Initial Contributors:
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* Nokia Corporation - initial contribution.
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*
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* Contributors:
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*
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* Description:
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* Implementation for test object factory
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*
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*/
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#include "testfactory.h"
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#include "testnull.h"
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#include "testboolean.h"
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#include "testint.h"
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#include "testbigint.h"
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#include "testoctetstr.h"
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#include "testoid.h"
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#include "testgeneralizedtime.h"
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#include "testsequence.h"
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#include "testexplicittag.h"
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#include "testimplicittag.h"
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#include "testoutput.h"
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// Make different object for each index, else return 0
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CTestBase* TTestFactory::MakeTestLC(const TInt aIndex)
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{
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switch (aIndex)
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{
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case 0:
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return CTestNull::NewLC();
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case 1:
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return CTestBoolean::NewLC();
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case 2:
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return CTestInt::NewLC();
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case 3:
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return CTestBigInt::NewLC();
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case 4:
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return CTestOctetString::NewLC();
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case 5:
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return CTestOID::NewLC();
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case 6:
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return CTestGeneralizedTime::NewLC();
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case 7:
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return CTestSequence::NewLC();
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case 8:
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return CTestExplicitTag::NewLC();
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case 9:
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return CTestImplicitTag::NewLC();
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case 10:
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return CTestOutput::NewLC();
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default:
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return 0;
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}
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}
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