os/kernelhwsrv/kerneltest/e32test/usbho/t_usbdi/inc/PBASE-T_USBDI-0476.h
author sl
Tue, 10 Jun 2014 14:32:02 +0200
changeset 1 260cb5ec6c19
permissions -rw-r--r--
Update contrib.
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#ifndef __TEST_CASE_PBASE_T_USBDI_0476_H
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#define __TEST_CASE_PBASE_T_USBDI_0476_H
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/*
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* Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
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* All rights reserved.
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* This component and the accompanying materials are made available
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* under the terms of the License "Eclipse Public License v1.0"
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* which accompanies this distribution, and is available
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* at the URL "http://www.eclipse.org/legal/epl-v10.html".
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*
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* Initial Contributors:
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* Nokia Corporation - initial contribution.
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*
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* Contributors:
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*
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* Description:
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* @file PBASE-T_USBDI-0476.h
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* @internalComponent
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* 
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*
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*/
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#include "basetestcase.h"
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#include "testcasefactory.h"
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#include "FDFActor.h"
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#include <d32usbc.h>
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#include <e32debug.h>
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#include "hosttransfers.h"
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namespace NUnitTesting_USBDI
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	{
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/**
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	@SYMTestCaseID				PBASE-T_USBDI-0476
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	@SYMTestCaseDesc			Validation of USB descriptors containing one or more IADs.
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	@SYMFssID 
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	@SYMPREQ					1782
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	@SYMREQ						7058 - [USBD : Descriptor access]
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                                7060 - [USBD : Descriptor access: backward compatibility]
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	@SYMTestType				UT
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	@SYMTestPriority			1 
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	@SYMTestActions 			1. Parse descriptors using raw data sets.	
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                                2. Process descriptors 	
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                                3. Compare generated trees to reference ones.	
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	@SYMTestExpectedResults 	No errors
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	@SYMTestStatus				Implemented
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*/
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class CUT_PBASE_T_USBDI_0476 : public CBaseTestCase
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	{
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public:
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	static CUT_PBASE_T_USBDI_0476* NewL(TBool aHostRole);
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	~CUT_PBASE_T_USBDI_0476(); 
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public: // From MUsbBusObserver
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	void DeviceInsertedL(TUint aDeviceHandle);
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	void DeviceRemovedL(TUint aDeviceHandle);
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	void BusErrorL(TInt aError);
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	void DeviceStateChangeL(RUsbDevice::TDeviceState aPreviousState,RUsbDevice::TDeviceState aNewState,
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		TInt aCompletionCode);
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public: // From MTransferObserver
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	void TransferCompleteL(TInt aTransferId,TInt aCompletionCode);
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private:
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	CUT_PBASE_T_USBDI_0476(TBool aHostRole);
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	void ConstructL();
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	void ExecuteHostTestCaseL();
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	void ExecuteDeviceTestCaseL();
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	void HostDoCancel();
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	void DeviceDoCancel();
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	void HostRunL();
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	void DeviceRunL();
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private:
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	enum TCaseStep
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		{
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		EInProgress,
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		EPassed,
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		EFailed
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		};
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	TCaseStep iCaseStep;
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private:
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	/**
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	The functor for this test case for the factory
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	*/
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	const static TFunctorTestCase<CUT_PBASE_T_USBDI_0476,TBool> iFunctor;
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	};
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	}
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#endif