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// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
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// All rights reserved.
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// This component and the accompanying materials are made available
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// under the terms of "Eclipse Public License v1.0"
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// which accompanies this distribution, and is available
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// at the URL "http://www.eclipse.org/legal/epl-v10.html".
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//
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// Initial Contributors:
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// Nokia Corporation - initial contribution.
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//
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// Contributors:
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//
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// Description:
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//
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#include "textendedbitmap.h"
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#include "tdirectgditestbase.h"
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#include <gdi.h>
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#include <s32mem.h>
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#include <e32base.h>
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#include <e32uid.h>
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const TInt KIterationsToTest = 1000;
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const TDisplayMode KDisplayMode = EColor64K;
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// Test the performance of extended bitmaps using the extended bitmap
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// Uid supported by the test example rasterizer
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const TUid KExtendedBitmapUid = {0x10285A78};
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CTExtendedBitmap::CTExtendedBitmap()
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{
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SetTestStepName(KTExtendedBitmap);
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}
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CTExtendedBitmap::~CTExtendedBitmap()
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{
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delete iExtendedBmp;
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delete [] iExtendedBmpData;
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delete iNormalBmp;
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delete iTargetBmp;
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delete iBitmapDevice;
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delete iBitGc;
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}
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/**
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Override of base class pure virtual
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Our implementation only gets called if the base class doTestStepPreambleL() did
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not leave. That being the case, the current test result value will be EPass.
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@return - TVerdict code
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*/
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TVerdict CTExtendedBitmap::doTestStepL()
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{
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0159"));
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CreateExtendedBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0160"));
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DeleteExtendedBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0161"));
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GetScanlinePreRenderedExtendedBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0162"));
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GetScanlineNonPreRenderedExtendedBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0163"));
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BitBltExtendedBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0164"));
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BitBltNormalBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0165"));
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DrawBitmapExtendedBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0166"));
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DrawBitmapNormalBitmapL();
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0173"));
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GetPixelL(ETrue); // extended bitmap
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RecordTestResultL();
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SetTestStepID(_L("GRAPHICS-UI-BENCH-0173"));
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GetPixelL(EFalse); // normal bitmap
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RecordTestResultL();
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return TestStepResult();
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}
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/**
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Called before doTestStepL() to allow
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initialization steps common to each test case to take place.
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@return - TVerdict code
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*/
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TVerdict CTExtendedBitmap::doTestStepPreambleL()
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{
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TVerdict res = CTe_graphicsperformanceSuiteStepBase::doTestStepPreambleL();
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const TRgb colors[] = {TRgb(0,255,255), TRgb(255,0,255), TRgb(255,255,0)};
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const TInt numColors = sizeof(colors)/sizeof(colors[0]);
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const TUint8 stripe = 1; // 1 mean draw horizontal stripes, 0 means draw vertical stripes
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iExtendedBmpDataSize = sizeof(colors)+sizeof(stripe); // estimate the data size
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iExtendedBmpData = new(ELeave) TUint8[iExtendedBmpDataSize];
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RMemWriteStream ws;
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ws.Open(iExtendedBmpData, iExtendedBmpDataSize);
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CleanupClosePushL(ws);
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for (TInt i = 0; i < numColors; i++)
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{
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ws << colors[i];
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}
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ws << stripe;
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iExtendedBmpDataSize = ws.Sink()->TellL(MStreamBuf::EWrite).Offset(); // get the actual size written
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CleanupStack::PopAndDestroy(&ws);
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iExtendedBmp = new(ELeave) CFbsBitmap;
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TInt err = iExtendedBmp->CreateExtendedBitmap(KBitmapSize, KDisplayMode, KExtendedBitmapUid, iExtendedBmpData, iExtendedBmpDataSize);
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TESTL(err == KErrNone);
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iNormalBmp = new(ELeave) CFbsBitmap;
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err = iNormalBmp->Create(KBitmapSize, KDisplayMode);
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TESTL(err == KErrNone);
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iTargetBmp = new(ELeave) CFbsBitmap;
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err = iTargetBmp->Create(KBitmapSize, KDisplayMode);
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TESTL(err == KErrNone);
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iBitmapDevice = CFbsBitmapDevice::NewL(iTargetBmp);
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TESTL(iBitmapDevice != NULL);
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iBitGc = CFbsBitGc::NewL();
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iBitGc->Activate(iBitmapDevice);
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iRasterizer = CFbsBitmap::Rasterizer();
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if (iRasterizer == NULL)
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{
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INFO_PRINTF1(_L("Error: Extended bitmap tests only work when the example rasterizer is available, make sure \"-DFBSRASTERIZER_DLL=fbsrasterizer_test.dll\" is included in your rombuild command."));
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User::Leave(KErrGeneral);
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}
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return res;
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}
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/**
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@SYMTestCaseID
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GRAPHICS-UI-BENCH-0159
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@SYMPREQ
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PREQ2096
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@SYMREQ
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REQ10847
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REQ10849
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@SYMTestCaseDesc
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The test determines how long it takes to create an extended bitmap.
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@SYMTestActions
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Measure the average time taken to create an extended bitmap by creating an
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extended bitmap 1000 times and then calculating the average time.
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@SYMTestExpectedResults
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Test should pass and display total test time and time per extended bitmap creation.
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*/
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void CTExtendedBitmap::CreateExtendedBitmapL()
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{
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CFbsBitmap* bmp = new(ELeave) CFbsBitmap;
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TESTL(bmp != NULL);
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CleanupStack::PushL(bmp);
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iProfiler->InitResults();
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for(TInt count=KIterationsToTest; count>0; --count)
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{
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iProfiler->StartTimer();
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TInt err = bmp->CreateExtendedBitmap(KBitmapSize, EColor64K, KExtendedBitmapUid, iExtendedBmpData, iExtendedBmpDataSize);
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iProfiler->MarkResultSetL();
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TESTL(err == KErrNone);
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// Reset the bitmap so the time taken to reset it the next time CreateExtendedBitmap()
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// is called is not included in the test
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bmp->Reset();
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}
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iProfiler->ResultsAnalysis(_L("Create-ExtendedBitmap-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
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CleanupStack::PopAndDestroy(bmp);
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}
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/**
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@SYMTestCaseID
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GRAPHICS-UI-BENCH-0160
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@SYMPREQ
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PREQ2096
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@SYMREQ
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REQ10847
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REQ10849
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@SYMTestCaseDesc
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The test determines how long it takes to delete an extended bitmap.
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@SYMTestActions
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Measure the average time taken to delete an extended bitmap by creating and
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deleting an extended bitmap 1000 times and then calculating the average time for the deletion.
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@SYMTestExpectedResults
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Test should pass and display total test time and time per extended bitmap deletion.
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*/
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void CTExtendedBitmap::DeleteExtendedBitmapL()
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{
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CFbsBitmap* bmp = new(ELeave) CFbsBitmap;
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TESTL(bmp != NULL);
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CleanupStack::PushL(bmp);
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iProfiler->InitResults();
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for(TInt count=KIterationsToTest; count>0; --count)
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{
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TInt err = bmp->CreateExtendedBitmap(KBitmapSize, EColor64K, KExtendedBitmapUid, iExtendedBmpData, iExtendedBmpDataSize);
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TESTL(err == KErrNone);
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CleanupStack::Pop(bmp);
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iProfiler->StartTimer();
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delete bmp;
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iProfiler->MarkResultSetL();
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bmp = new(ELeave) CFbsBitmap;
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TESTL(bmp != NULL);
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CleanupStack::PushL(bmp);
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}
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iProfiler->ResultsAnalysis(_L("Delete-ExtendedBitmap-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
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CleanupStack::PopAndDestroy(bmp);
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}
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/**
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@SYMTestCaseID
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GRAPHICS-UI-BENCH-0161
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@SYMPREQ
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PREQ2096
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@SYMREQ
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REQ10847
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REQ10860
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@SYMTestCaseDesc
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Measure the average time taken to get a scanline from an extended bitmap directly using
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the example rasterizer where there is one call to BeginBitmap() and EndBitmap() for
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many GetScanLine() calls. This test only measures the performance of the example rasterizer.
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It is included here to help isolate performance changes in CTExtendedBitmap::BitBltExtendedBitmapL()
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and CTExtendedBitmap::DrawBitmapExtendedBitmapL().
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@SYMTestActions
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Measure the average time taken to get a scanline from an extended bitmap directly using
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the example rasterizer by calling CFbsRasterizer::ScanLine() 1000 times for an extended
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bitmap.
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@SYMTestExpectedResults
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Test should pass and display total test time and time per scanline.
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@see GetScanlineNonPreRenderedExtendedBitmapL()
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*/
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void CTExtendedBitmap::GetScanlinePreRenderedExtendedBitmapL()
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{
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CFbsRasterizer::TBitmapDesc bitmapDesc;
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TInt64 bitmapId = iExtendedBmp->SerialNumber();
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bitmapDesc.iSizeInPixels = KBitmapSize;
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bitmapDesc.iDispMode = KDisplayMode;
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bitmapDesc.iDataType = KExtendedBitmapUid;
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bitmapDesc.iData = iExtendedBmpData;
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bitmapDesc.iDataSize = iExtendedBmpDataSize;
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iRasterizer->BeginBitmap(bitmapId, bitmapDesc, NULL);
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TInt h;
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const TUint32* scanline;
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TPoint point(0,0);
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iProfiler->InitResults();
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for(TInt count=KIterationsToTest; count>0; --count)
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{
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for (h = 0; h < KBitmapSize.iHeight; h++)
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{
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point.iY = h;
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scanline = iRasterizer->ScanLine(bitmapId, point, KBitmapSize.iWidth);
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TESTL(scanline != NULL);
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}
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iProfiler->MarkResultSetL();
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}
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iProfiler->ResultsAnalysis(_L("GetScanline-PreRendered-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
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iRasterizer->EndBitmap(bitmapId);
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}
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/**
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@SYMTestCaseID
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GRAPHICS-UI-BENCH-0162
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@SYMPREQ PREQ2096
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@SYMREQ
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REQ10847
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REQ10860
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@SYMTestCaseDesc
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Measure the average time taken to get a scanline from an extended bitmap directly using
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the example rasterizer where the calls to BeginBitmap() and EndBitmap() are done for each
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GetScanLine().
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@SYMTestActions
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Call CFbsRasterizer::ScanLine() 1000 times for an extended bitmap. This test case is similar
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to GetScanlinePreRenderedExtendedBitmapL() but in this case each CFbsRasterizer::ScanLine()
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call is bracketed by CFbsRasterizer::BeginBitmap() and CFbsRasterizer::EndBitmap() to highlight
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the performance hit that would be seen by an application calling CFbsBitmap::GetScanLine()
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when using an extended bitmap rasterizer that does not have a cache.
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@SYMTestExpectedResults
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Test should pass and display total test time and time per scanline when bracketed by
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CFbsRasterizer::BeginBitmap() and CFbsRasterizer::EndBitmap().
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@see GetScanlinePreRenderedExtendedBitmapL()
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*/
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void CTExtendedBitmap::GetScanlineNonPreRenderedExtendedBitmapL()
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{
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CFbsRasterizer::TBitmapDesc bitmapDesc;
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TInt64 bitmapId = iExtendedBmp->SerialNumber();
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bitmapDesc.iSizeInPixels = KBitmapSize;
|
sl@0
|
327 |
bitmapDesc.iDispMode = KDisplayMode;
|
sl@0
|
328 |
bitmapDesc.iDataType = KExtendedBitmapUid;
|
sl@0
|
329 |
bitmapDesc.iData = iExtendedBmpData;
|
sl@0
|
330 |
bitmapDesc.iDataSize = iExtendedBmpDataSize;
|
sl@0
|
331 |
|
sl@0
|
332 |
TInt h;
|
sl@0
|
333 |
const TUint32* scanline;
|
sl@0
|
334 |
TPoint point(0,0);
|
sl@0
|
335 |
|
sl@0
|
336 |
iProfiler->InitResults();
|
sl@0
|
337 |
for(TInt count=KIterationsToTest; count>0; --count)
|
sl@0
|
338 |
{
|
sl@0
|
339 |
for (h = 0; h < KBitmapSize.iHeight; h++)
|
sl@0
|
340 |
{
|
sl@0
|
341 |
// Only the first call to BeginBitmap() should cause rasterization of the bitmap,
|
sl@0
|
342 |
// since the test rasterizer has a cache of recently used bitmaps.
|
sl@0
|
343 |
iRasterizer->BeginBitmap(bitmapId, bitmapDesc, NULL);
|
sl@0
|
344 |
point.iY = h;
|
sl@0
|
345 |
scanline = iRasterizer->ScanLine(bitmapId, point, KBitmapSize.iWidth);
|
sl@0
|
346 |
TESTL(scanline != NULL);
|
sl@0
|
347 |
iRasterizer->EndBitmap(bitmapId);
|
sl@0
|
348 |
}
|
sl@0
|
349 |
iProfiler->MarkResultSetL();
|
sl@0
|
350 |
}
|
sl@0
|
351 |
iProfiler->ResultsAnalysis(_L("GetScanline-NonPreRendered-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
|
sl@0
|
352 |
}
|
sl@0
|
353 |
|
sl@0
|
354 |
/**
|
sl@0
|
355 |
@SYMTestCaseID
|
sl@0
|
356 |
GRAPHICS-UI-BENCH-0163
|
sl@0
|
357 |
|
sl@0
|
358 |
@SYMPREQ
|
sl@0
|
359 |
PREQ2096
|
sl@0
|
360 |
|
sl@0
|
361 |
@SYMREQ
|
sl@0
|
362 |
REQ10857
|
sl@0
|
363 |
REQ10859
|
sl@0
|
364 |
|
sl@0
|
365 |
@SYMTestCaseDesc
|
sl@0
|
366 |
The test determines how long it takes to BitBlt() an extended bitmap to an offscreen bitmap.
|
sl@0
|
367 |
This test is paired with BitBltNormalBitmapL().
|
sl@0
|
368 |
|
sl@0
|
369 |
@SYMTestActions
|
sl@0
|
370 |
Measure the time taken to BitBlt() an extended bitmap to an offscreen buffer 1000 times
|
sl@0
|
371 |
and calculate the average time taken.
|
sl@0
|
372 |
|
sl@0
|
373 |
@SYMTestExpectedResults
|
sl@0
|
374 |
Test should pass and display total test time and time per image BitBlt().
|
sl@0
|
375 |
|
sl@0
|
376 |
@see BitBltNormalBitmapL()
|
sl@0
|
377 |
*/
|
sl@0
|
378 |
void CTExtendedBitmap::BitBltExtendedBitmapL()
|
sl@0
|
379 |
{
|
sl@0
|
380 |
const TPoint pt(0,0);
|
sl@0
|
381 |
|
sl@0
|
382 |
iProfiler->InitResults();
|
sl@0
|
383 |
for(TInt count=KIterationsToTest; count>0; --count)
|
sl@0
|
384 |
{
|
sl@0
|
385 |
iBitGc->BitBlt(pt, iExtendedBmp);
|
sl@0
|
386 |
iProfiler->MarkResultSetL();
|
sl@0
|
387 |
}
|
sl@0
|
388 |
iProfiler->ResultsAnalysis(_L("BitBlt-ExtendedBitmap-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
|
sl@0
|
389 |
}
|
sl@0
|
390 |
|
sl@0
|
391 |
/**
|
sl@0
|
392 |
@SYMTestCaseID
|
sl@0
|
393 |
GRAPHICS-UI-BENCH-0164
|
sl@0
|
394 |
|
sl@0
|
395 |
@SYMPREQ PREQ2096
|
sl@0
|
396 |
|
sl@0
|
397 |
@SYMTestCaseDesc
|
sl@0
|
398 |
The test determines how long it takes to BitBlt() a standard bitmap that is the same size
|
sl@0
|
399 |
as the extended bitmap used in the previous test case BitBltExtendedBitmapL().
|
sl@0
|
400 |
This test is paired with BitBltExtendedBitmapL().
|
sl@0
|
401 |
|
sl@0
|
402 |
@SYMTestActions
|
sl@0
|
403 |
Measure the time taken to BitBlt() a normal bitmap to an offscreen buffer 1000 times
|
sl@0
|
404 |
and calculate the average time taken.
|
sl@0
|
405 |
|
sl@0
|
406 |
@SYMTestExpectedResults
|
sl@0
|
407 |
Test should pass and display total test time and time per image BitBlt().
|
sl@0
|
408 |
|
sl@0
|
409 |
@see BitBltExtendedBitmapL()
|
sl@0
|
410 |
*/
|
sl@0
|
411 |
void CTExtendedBitmap::BitBltNormalBitmapL()
|
sl@0
|
412 |
{
|
sl@0
|
413 |
const TPoint pt(0,0);
|
sl@0
|
414 |
|
sl@0
|
415 |
iProfiler->InitResults();
|
sl@0
|
416 |
for(TInt count=KIterationsToTest; count>0; --count)
|
sl@0
|
417 |
{
|
sl@0
|
418 |
iBitGc->BitBlt(pt, iNormalBmp);
|
sl@0
|
419 |
iProfiler->MarkResultSetL();
|
sl@0
|
420 |
}
|
sl@0
|
421 |
iProfiler->ResultsAnalysis(_L("BitBlt-NormalBitmap-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
|
sl@0
|
422 |
}
|
sl@0
|
423 |
|
sl@0
|
424 |
/**
|
sl@0
|
425 |
@SYMTestCaseID
|
sl@0
|
426 |
GRAPHICS-UI-BENCH-0165
|
sl@0
|
427 |
|
sl@0
|
428 |
@SYMPREQ
|
sl@0
|
429 |
PREQ2096
|
sl@0
|
430 |
|
sl@0
|
431 |
@SYMREQ
|
sl@0
|
432 |
REQ10857
|
sl@0
|
433 |
REQ10859
|
sl@0
|
434 |
|
sl@0
|
435 |
@SYMTestCaseDesc
|
sl@0
|
436 |
The test determines how long it takes to draw an extended bitmap to an offscreen bitmap
|
sl@0
|
437 |
using DrawBitmap(). This test is paired with DrawBitmapNormalBitmapL().
|
sl@0
|
438 |
|
sl@0
|
439 |
@SYMTestActions
|
sl@0
|
440 |
Measure the time taken to DrawBitmap() an extended bitmap to an offscreen buffer 1000 times
|
sl@0
|
441 |
and calculate the average time taken. This test is paired with DrawBitmapNormalBitmapL().
|
sl@0
|
442 |
|
sl@0
|
443 |
@SYMTestExpectedResults
|
sl@0
|
444 |
Test should pass and display total test time and time per image DrawBitmap().
|
sl@0
|
445 |
|
sl@0
|
446 |
@see DrawBitmapNormalBitmapL()
|
sl@0
|
447 |
*/
|
sl@0
|
448 |
void CTExtendedBitmap::DrawBitmapExtendedBitmapL()
|
sl@0
|
449 |
{
|
sl@0
|
450 |
const TPoint pt(0,0);
|
sl@0
|
451 |
const TRect rect(pt, KBitmapSize);
|
sl@0
|
452 |
|
sl@0
|
453 |
iProfiler->InitResults();
|
sl@0
|
454 |
for(TInt count=KIterationsToTest; count>0; --count)
|
sl@0
|
455 |
{
|
sl@0
|
456 |
iBitGc->DrawBitmap(rect, iExtendedBmp, rect);
|
sl@0
|
457 |
iProfiler->MarkResultSetL();
|
sl@0
|
458 |
}
|
sl@0
|
459 |
iProfiler->ResultsAnalysis(_L("DrawBitmap-ExtendedBitmap-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
|
sl@0
|
460 |
}
|
sl@0
|
461 |
|
sl@0
|
462 |
/**
|
sl@0
|
463 |
@SYMTestCaseID
|
sl@0
|
464 |
GRAPHICS-UI-BENCH-0166
|
sl@0
|
465 |
|
sl@0
|
466 |
@SYMPREQ PREQ2096
|
sl@0
|
467 |
|
sl@0
|
468 |
@SYMTestCaseDesc
|
sl@0
|
469 |
The test determines how long it takes to draw a standard bitmap that is the same size
|
sl@0
|
470 |
as the extended bitmap used in the previous test case (DrawBitmapExtendedBitmapL())
|
sl@0
|
471 |
using DrawBitmap(). This test is paired with DrawBitmapExtendedBitmapL().
|
sl@0
|
472 |
This test is paired with DrawBitmapExtendedBitmapL().
|
sl@0
|
473 |
|
sl@0
|
474 |
@SYMTestActions
|
sl@0
|
475 |
Measure the time taken to DrawBitmap() a normal bitmap to an offscreen buffer 1000 times
|
sl@0
|
476 |
and calculate the average time taken.
|
sl@0
|
477 |
|
sl@0
|
478 |
@SYMTestExpectedResults
|
sl@0
|
479 |
Test should pass and display total test time and time per image DrawBitmap().
|
sl@0
|
480 |
|
sl@0
|
481 |
@see DrawBitmapExtendedBitmapL()
|
sl@0
|
482 |
*/
|
sl@0
|
483 |
void CTExtendedBitmap::DrawBitmapNormalBitmapL()
|
sl@0
|
484 |
{
|
sl@0
|
485 |
const TPoint pt(0,0);
|
sl@0
|
486 |
const TRect rect(pt, KBitmapSize);
|
sl@0
|
487 |
|
sl@0
|
488 |
iProfiler->InitResults();
|
sl@0
|
489 |
for(TInt count=KIterationsToTest; count>0; --count)
|
sl@0
|
490 |
{
|
sl@0
|
491 |
iBitGc->DrawBitmap(rect, iNormalBmp, rect);
|
sl@0
|
492 |
iProfiler->MarkResultSetL();
|
sl@0
|
493 |
}
|
sl@0
|
494 |
iProfiler->ResultsAnalysis(_L("DrawBitmap-NormalBitmap-64K"), 0, EColor64K, EColor64K, KIterationsToTest);
|
sl@0
|
495 |
}
|
sl@0
|
496 |
|
sl@0
|
497 |
/**
|
sl@0
|
498 |
@SYMTestCaseID
|
sl@0
|
499 |
GRAPHICS-UI-BENCH-0173
|
sl@0
|
500 |
|
sl@0
|
501 |
@SYMCR
|
sl@0
|
502 |
CR1804
|
sl@0
|
503 |
|
sl@0
|
504 |
@SYMREQ
|
sl@0
|
505 |
REQ10858
|
sl@0
|
506 |
|
sl@0
|
507 |
@SYMTestCaseDesc
|
sl@0
|
508 |
Measure the average time taken to get 128 pixels from a normal or extended bitmap.
|
sl@0
|
509 |
|
sl@0
|
510 |
@SYMTestActions
|
sl@0
|
511 |
Measure the average time taken to get 128 pixels from a normal or extended bitmap
|
sl@0
|
512 |
by calling CFbsBitmap::GetPixel() 1000 times on the bitmap.
|
sl@0
|
513 |
|
sl@0
|
514 |
@SYMTestExpectedResults
|
sl@0
|
515 |
Test should pass and display total test time and time per 128 pixels.
|
sl@0
|
516 |
*/
|
sl@0
|
517 |
void CTExtendedBitmap::GetPixelL(TBool aIsExtendedBmp)
|
sl@0
|
518 |
{
|
sl@0
|
519 |
CFbsBitmap* bmp = NULL;
|
sl@0
|
520 |
_LIT(KTestName, "GetPixel-%S-64K");
|
sl@0
|
521 |
TBuf<30> buf;
|
sl@0
|
522 |
|
sl@0
|
523 |
if (aIsExtendedBmp)
|
sl@0
|
524 |
{
|
sl@0
|
525 |
_LIT(KExtBmpName, "ExtendedBitmap");
|
sl@0
|
526 |
buf.Format(KTestName, &KExtBmpName);
|
sl@0
|
527 |
bmp= iExtendedBmp;
|
sl@0
|
528 |
}
|
sl@0
|
529 |
else
|
sl@0
|
530 |
{
|
sl@0
|
531 |
_LIT(KNormalBmpName, "NormalBitmap");
|
sl@0
|
532 |
buf.Format(KTestName, &KNormalBmpName);
|
sl@0
|
533 |
bmp = iNormalBmp;
|
sl@0
|
534 |
}
|
sl@0
|
535 |
|
sl@0
|
536 |
TInt y;
|
sl@0
|
537 |
TPoint point(0,0);
|
sl@0
|
538 |
TRgb color;
|
sl@0
|
539 |
iProfiler->InitResults();
|
sl@0
|
540 |
for(TInt count=KIterationsToTest; count>0; --count)
|
sl@0
|
541 |
{
|
sl@0
|
542 |
for (y = 0; y < KBitmapSize.iHeight; ++y)
|
sl@0
|
543 |
{
|
sl@0
|
544 |
point.iY = y;
|
sl@0
|
545 |
bmp->GetPixel(color, point);
|
sl@0
|
546 |
}
|
sl@0
|
547 |
iProfiler->MarkResultSetL();
|
sl@0
|
548 |
}
|
sl@0
|
549 |
iProfiler->ResultsAnalysis(buf, 0, KDisplayMode, KDisplayMode, KIterationsToTest);
|
sl@0
|
550 |
}
|